Performance investigation of pattern effect suppression in semiconductor optical amplifier using optical delay interferometer

被引：0
|
作者：
Zoiros, K. E. [1 ]
Siarkos, T. [1 ]
Koukourlis, C. S. [1 ]
机构：
[1] Democritus Univ Thrace, Dept Elect & Comp Engn, GR-67100 Xanthi, Greece
来源：
CSNDSP 08: PROCEEDINGS OF THE SIXTH INTERNATIONAL SYMPOSIUM ON COMMUNICATION SYSTEMS, NETWORKS AND DIGITAL SIGNAL PROCESSING | 2008年
关键词：
D O I：
10.1109/CSNDSP.2008.4610762
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
The ability of an optical delay interferometer (ODI) to suppress the pattern effect in a semiconductor optical amplifier (SOA) whose dynamic response is slower than the period of its driving high-speed return-to-zero (RZ) data signal is demonstrated through numerical simulation and theoretical analysis.
引用
收藏
页码：680 / 684
页数：5
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