Reliability prediction and assessment of electronic systems and equipment

被引：1
|
作者：
Cartwright, J [1 ]
Donahoe, DN
Jackson, M
机构：
[1] Honeywell Microswitch, Freeport, IL 61032 USA
[2] Compaq Comp Corp, Houston, TX 77269 USA
[3] CALCE Elect Prod & Syst Consortium, College Pk, MD 20742 USA
来源：
IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES | 1999年 / 22卷 / 01期
关键词：
D O I：
10.1109/TCAPT.1999.759362
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
[No abstract available]
引用
收藏
页码：127 / 128
页数：2
相关论文
共 50 条
  • [31] PREDICTING THE RELIABILITY OF ELECTRONIC EQUIPMENT - PROLOG
    ODONNELL, R
    [J]. PROCEEDINGS OF THE IEEE, 1994, 82 (07) : 990 - 991
  • [32] Material improves the reliability of electronic equipment
    不详
    [J]. AIRCRAFT ENGINEERING AND AEROSPACE TECHNOLOGY, 1999, 71 (06): : 615 - 616
  • [33] RELIABILITY ASSESSMENT FOR COMMUNICATION EQUIPMENT
    CLOUGH, ID
    [J]. ELECTRONIC ENGINEERING, 1979, 51 (620): : 48 - &
  • [34] THE ASSESSMENT OF FLEET EQUIPMENT RELIABILITY
    TRINER, DA
    [J]. RELIABILITY ENGINEERING & SYSTEM SAFETY, 1986, 14 (01) : 63 - 74
  • [35] Reliability Assessment of Multistate Degraded Systems: An Application to Power Electronic Systems
    Samavatian, Vahid
    Iman-Eini, Hossein
    Avenas, Yvan
    [J]. IEEE TRANSACTIONS ON POWER ELECTRONICS, 2020, 35 (04) : 4024 - 4032
  • [36] Reliability Assessment and Prediction of Open Source Software Systems
    Singh, Jitendra
    Maurya, L. S.
    [J]. 2013 IEEE SECOND INTERNATIONAL CONFERENCE ON IMAGE INFORMATION PROCESSING (ICIIP), 2013, : 6 - 11
  • [37] PREDICTION METHODS FOR EQUIPMENT RELIABILITY EVALUATION
    EAMES, AR
    [J]. RADIO AND ELECTRONIC ENGINEER, 1978, 48 (7-8): : 333 - 340
  • [38] AI-BASED RELIABILITY ASSESSMENT OF POWER ELECTRONIC SYSTEMS
    McCluskey, F. Patrick
    Buxbaum, Clifton
    Mazumder, Sudip K.
    Sarwat, Arif
    Ursino, Matt
    Russell, Miles C.
    [J]. PROCEEDINGS OF ASME 2022 INTERNATIONAL TECHNICAL CONFERENCE AND EXHIBITION ON PACKAGING AND INTEGRATION OF ELECTRONIC AND PHOTONIC MICROSYSTEMS, INTERPACK2022, 2022,
  • [39] Interconnection Reliability Assessment For Electronic Equipment Exposed to Chlorine Dioxide Used For Biological Decontamination
    Xu, C.
    Fleming, D.
    Mandich, M. L.
    Reents, W. D.
    Derkits, G. E.
    Franey, J. P.
    Kopf, R.
    Ryan, S.
    [J]. PROCEEDINGS OF THE FIFTY-SIXTH IEEE HOLM CONFERENCE ON ELECTRICAL CONTACTS, 2010, : 551 - 563
  • [40] RELIABILITY PREDICTION OF ELECTRONIC PACKAGES
    DASGUPTA, A
    BARKER, D
    PECHT, M
    [J]. JOURNAL OF THE IES, 1990, 33 (03): : 36 - 45
12345