Reliability prediction and assessment of electronic systems and equipment

被引：1

作者：

Cartwright, J ^{[1
]}

Donahoe, DN

Jackson, M

机构：

[1] Honeywell Microswitch, Freeport, IL 61032 USA

[2] Compaq Comp Corp, Houston, TX 77269 USA

[3] CALCE Elect Prod & Syst Consortium, College Pk, MD 20742 USA

来源：

IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES | 1999年 / 22卷 / 01期

关键词：

D O I：

10.1109/TCAPT.1999.759362

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

[No abstract available]

引用

页码：127 / 128

页数：2

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