Two-tone vs. single-tone measurement of second-order nonlinearity

被引：0
|
作者：
Agahi, D [1 ]
Domino, W [1 ]
Vakilian, N [1 ]
机构：
[1] Conexant Syst Inc, Newport Beach, CA 92660 USA
来源：
MICROWAVE JOURNAL | 2002年 / 45卷 / 03期
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D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页码：82 / +
页数：9
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