Laser-induced damage in SiO2 and CaF2 with picosecond and femtosecond laser pulses

被引:120
|
作者
Varel, H [1 ]
Ashkenasi, D [1 ]
Rosenfeld, A [1 ]
Herrmann, R [1 ]
Noack, F [1 ]
Campbell, EEB [1 ]
机构
[1] FREE UNIV BERLIN,FACHBEREICH PHYS,D-14195 BERLIN,GERMANY
来源
关键词
D O I
10.1007/BF01575098
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Single- and multiple-shot damage thresholds and plasma-emission thresholds for fused silica and CaF2 are reported for 790 nm photons as a function of laser pulse width (190 fs - 4.5 ps). The results are compared with single-shot plasma-emission measurements [1] and with multiple-shot damage measurements [2]. Both the damage threshold and the plasma-emission threshold are shown to decrease with decreasing pulse width over the entire pulse-width range investigated.
引用
收藏
页码:293 / 294
页数:2
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