Analysis of Speckle Pattern Interferometry System

被引:0
|
作者
Shamsir, A. A. M. [1 ]
Jafri, M. Z. M. [1 ]
机构
[1] Univ Sains Malaysia, Sch Phys, George Town, Malaysia
来源
关键词
ESPI; interferometry; speckle pattern;
D O I
暂无
中图分类号
X [环境科学、安全科学];
学科分类号
08 ; 0830 ;
摘要
The ESPI measurement on an object is dependent on the direction in which the object is deformed. When the object is displaced or deformed in the direction normal to viewing direction, the phase of one beam increase, so that the relative phase of the two beams changes. When this change is a multiple of 2p, the speckle pattern remains the same, while elsewhere it changes. In this research field, this method is widely used to develop a new laboratory setup for implementing the speckle pattern interferometry. In speckle interferometry, an optically rough test surface is illuminated with an expanded laser beam creating a laser speckle pattern in the space surrounding the illuminated region. The speckle pattern is optically mixed with a second coherent light field that is either another speckle pattern or a smooth light field. This produces an interferometric speckle pattern that will be detected by sensor to count the change of the speckle pattern due to force given. In this project, an experimental setup of ESPI is proposed to analyze a stainless steel plate using 632.8nm (red) wavelength of lights.
引用
收藏
页码:273 / 275
页数:3
相关论文
共 50 条
  • [31] ANALYSIS OF ROTATING COMPONENT STRAINS USING ELECTRONIC SPECKLE PATTERN INTERFEROMETRY
    PREATER, RWT
    PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS, 1984, 473 : 40 - 43
  • [32] GENERAL-ANALYSIS OF FRINGE CONTRAST IN ELECTRONIC SPECKLE PATTERN INTERFEROMETRY
    SLETTEMOEN, GA
    OPTICA ACTA, 1979, 26 (03): : 313 - 327
  • [33] Analysis of coherent symmetrical illumination for electronic speckle pattern shearing interferometry
    Román, JF
    Moreno, V
    Petzing, JN
    Tyrer, JR
    JOURNAL OF MODERN OPTICS, 2005, 52 (06) : 797 - 812
  • [34] Thermal strain analysis of composite materials by electronic speckle pattern interferometry
    Kim, KS
    Jang, WS
    Hong, MS
    Kang, KS
    Jung, HC
    Kang, YJ
    Yang, SP
    KSME INTERNATIONAL JOURNAL, 2000, 14 (05): : 477 - 482
  • [35] Double-pulse digital speckle pattern interferometry for vibration analysis
    Zhang, Dazhi
    Xue, Jingfeng
    Chen, Lu
    Wen, Juying
    Wang, Jingjing
    INTERNATIONAL SYMPOSIUM ON OPTOELECTRONIC TECHNOLOGY AND APPLICATION 2014: LASER AND OPTICAL MEASUREMENT TECHNOLOGY; AND FIBER OPTIC SENSORS, 2014, 9297
  • [36] Thermal strain analysis of composite materials by electronic speckle pattern interferometry
    Koung Suk Kim
    Wan Shik Jang
    Myung Seak Hong
    Ki Soo Kang
    Hyun Chul Jung
    Young Jun Kang
    Sung Pil Yang
    KSME International Journal, 2000, 14 : 477 - 482
  • [37] Comparative analysis of nanometric inspection methods in fringeless speckle pattern interferometry
    Etchepareborda, Pablo
    Laura Vadnjal, Ana
    Bianchetti, Arturo
    Veiras, Francisco E.
    Federico, Alejandro
    Kaufmann, Guillermo H.
    APPLIED OPTICS, 2017, 56 (03) : 365 - 374
  • [38] AN INSTRUMENT FOR VIBRATION MODE ANALYSIS USING ELECTRONIC SPECKLE PATTERN INTERFEROMETRY
    HURDEN, APM
    NDT INTERNATIONAL, 1982, 15 (03): : 143 - 148
  • [39] Considerations on speckle pattern interferometry of ultrasonic speckles
    Hong, SK
    Han, JB
    ULTRASONICS, 1997, 35 (04) : 329 - 332
  • [40] Temporal speckle pattern interferometry for vibration measurement
    Kauffmann, J
    Tiziani, HJ
    FIFTH INTERNATIONAL CONFERENCE ON VIBRATION MEASUREMENTS BY LASER TECHNIQUES: ADVANCES AND APPLICATIONS, 2002, 4827 : 133 - 136