A new InGaP GaAs double delta-doped heterojunction bipolar transistor (D3HBT)

被引:0
|
作者
Liu, WC [1 ]
Cheng, SY [1 ]
Chang, WL [1 ]
Pan, HJ [1 ]
Shie, YH [1 ]
机构
[1] Natl Cheng Kung Univ, Dept Elect Engn, Tainan 70101, Taiwan
关键词
D O I
10.1109/ICMMT.1998.768236
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The double delta-doped heterojunction bipolar transistor (D-3-HBT) is successfully fabricated with improved current-voltage characteristics by employing the insertion of delta-doped sheets at emitter-base (E-B) and base-collector (B-C) heterojunction, Due to the use of delta-doped sheets, the potential spikes at E-B and BC heterojunction are suppressed substantially. Thus a higher emitter injection efficiency (current gain) and a lower knee voltage are obtained. From experimental results, it is shown that the studied D(3)HBTdevice is a good candidate for high-speed and high-power circuit applications.
引用
下载
收藏
页码:100 / 103
页数:4
相关论文
共 50 条
  • [21] DOUBLE DELTA-DOPED FETS IN GAAS
    BOARD, K
    NUTT, HC
    ELECTRONICS LETTERS, 1992, 28 (05) : 469 - 471
  • [23] Characteristics of InGaP/GaAs co-integrated δ-doped heterojunction bipolar transistor and doped-channel field effect transistor
    Tsai, JH
    SOLID-STATE ELECTRONICS, 2002, 46 (01) : 45 - 48
  • [24] Effect of composite collector design on the breakdown behavior of InGaP/GaAs double heterojunction bipolar transistor
    Lew, KL
    Yoon, SF
    JOURNAL OF APPLIED PHYSICS, 2003, 93 (01) : 605 - 610
  • [25] MONOLAYER DELTA-DOPED HETEROJUNCTION BIPOLAR-TRANSISTOR CHARACTERISTICS FROM 10 TO 350 K
    GOOSSEN, KW
    CUNNINGHAM, JE
    KUO, TY
    JAN, WY
    FONSTAD, CG
    APPLIED PHYSICS LETTERS, 1991, 59 (06) : 682 - 684
  • [26] InGaP/GaAs/InGaP composite collector double heterojunction bipolar transistor with high breakdown, low offset, and knee voltage
    Lew, KL
    Zhang, R
    Yoon, SF
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2004, 22 (02): : 579 - 582
  • [27] InGaP/GaAs heterojunction bipolar transistor and RF power amplifier reliability
    Liu, Xiang
    Yuan, Jiann S.
    Liou, Juin J.
    MICROELECTRONICS RELIABILITY, 2008, 48 (8-9) : 1212 - 1215
  • [28] A study of composite-passivation of an InGaP/GaAs heterojunction bipolar transistor
    Fu, Ssu-I
    Cheng, Shiou-Ying
    Lai, Po-Hsien
    Tsai, Yan-Ying
    Hung, Ching-Wen
    Yen, Chih-Hung
    Liu, Wen-Chau
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2006, 153 (11) : G938 - G942
  • [29] Investigation of InGaP/GaAs heterojunction bipolar transistor with doping graded base
    Chen, YW
    Hsu, WC
    Hsu, RT
    Wu, YH
    Chen, YJ
    Lin, YS
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2003, 21 (06): : 2555 - 2557
  • [30] Investigation of an InGaP/GaAs resonant-tunneling heterojunction bipolar transistor
    Pan, HJ
    Feng, SC
    Wang, WC
    Lin, KW
    Yu, KH
    Wu, CZ
    Laih, LW
    Liu, WC
    SOLID-STATE ELECTRONICS, 2001, 45 (03) : 489 - 494