Leakage radiation interference microscopy

被引：30

作者：

Descrovi, Emiliano ^{[1
]}

Barakat, Elsie ^{[2
]}

Angelini, Angelo ^{[1
,3
]}

Munzert, Peter ^{[4
]}

De Leo, Natascia ^{[3
]}

Boarino, Luca ^{[3
]}

Giorgis, Fabrizio ^{[1
]}

Herzig, Hans Peter ^{[2
]}

机构：

[1] Politecn Torino, Dipartimento Sci Appl & Tecnol, I-10129 Turin, Italy

[2] Ecole Polytech Fed Lausanne, Opt & Photon Technol Lab, CH-2000 Neuchatel, Switzerland

[3] Ist Nazl Ric Metrol, Nanofacil, I-10135 Turin, Italy

[4] Fraunhofer Inst Appl Opt & Precis Engn IOF, D-07745 Jena, Germany

来源：

OPTICS LETTERS | 2013年 / 38卷 / 17期

基金：

瑞士国家科学基金会;

关键词：

BLOCH SURFACE-WAVES; INTERFEROMETRY; PROPAGATION;

D O I：

10.1364/OL.38.003374

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We present a proof of principle for a new imaging technique combining leakage radiation microscopy with high-resolution interference microscopy. By using oil immersion optics it is demonstrated that amplitude and phase can be retrieved from optical fields, which are evanescent in air. This technique is illustratively applied for mapping a surface mode propagating onto a planar dielectric multilayer on a thin glass substrate. The surface mode propagation constant estimated after Fourier transformation of the measured complex field is well matched with an independent measurement based on back focal plane imaging. (C) 2013 Optical Society of America

引用

页码：3374 / 3376

页数：3

共 50 条

[1] Study of interference between surface plasmon polaritons by leakage radiation microscopy
de Peralta, Luis Grave
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS, 2010, 27 (08) : 1513 - 1517
[2] Leakage radiation microscopy of surface plasmon polaritons
Drezet, A.
Hohenau, A.
Koller, D.
Stepanov, A.
Ditlbacher, H.
Steinberger, B.
Aussenegg, F. R.
Leitner, A.
Krenn, J. R.
[J]. MATERIALS SCIENCE AND ENGINEERING B-ADVANCED FUNCTIONAL SOLID-STATE MATERIALS, 2008, 149 (03): : 220 - 229
[3] Directional fluorescence emission characterized with leakage radiation microscopy
Zhang, D. G.
Yuan, X-C
Yuan, G. H.
Wang, P.
Ming, H.
[J]. JOURNAL OF OPTICS, 2010, 12 (03)
[4] Surface plasmon leakage radiation microscopy at the diffraction limit
Hohenau, A.
Krenn, J. R.
Drezet, A.
Mollet, O.
Huant, S.
Genet, C.
Stein, B.
Ebbesen, T. W.
[J]. OPTICS EXPRESS, 2011, 19 (25): : 25749 - 25762
[5] Influence of surface plasmon propagation on leakage radiation microscopy imaging
Guebrou, S. Aberra
Laverdant, J.
Symonds, C.
Vignoli, S.
Bessueille, F.
Bellessa, J.
[J]. APPLIED PHYSICS LETTERS, 2012, 101 (12)
[6] Out-of-focal plane imaging by leakage radiation microscopy
Zhu, Liangfu
Zhang, Douguo
Wang, Ruxue
Wen, Xiaolei
Wang, Pei
Ming, Hai
Badugu, Ramachandram
Lakowicz, Joseph R.
[J]. JOURNAL OF OPTICS, 2017, 19 (09)
[7] Rapid determination of fluorescent molecular orientation in leakage radiation microscopy
Chen, Yikai
Zhu, Shijun
Kan, Weiwei
Chen, Fulian
Zhang, Lu
Ding, Binxuan
Shen, Zhonghua
[J]. RESULTS IN PHYSICS, 2020, 16
[8] Characterization of a dye doped planar polymer waveguide by leakage radiation microscopy
Zhang, D. G.
Fu, Q.
Wang, X. X.
Chen, Y. K.
Wang, P.
Ming, H.
[J]. JOURNAL OF OPTICS, 2012, 14 (01)
[9] Defocus leakage radiation microscopy for single shot surface plasmon measurement
Chow, Terry W. K.
Lun, Daniel P. K.
Pechprasarn, Suejit
Somekh, Michael G.
[J]. MEASUREMENT SCIENCE AND TECHNOLOGY, 2020, 31 (07)
[10] Mode interference and radiation leakage in a tapered parallel plate waveguide for terahertz waves
Mueckstein, R.
Navarro-Cia, M.
Mitrofanov, O.
[J]. APPLIED PHYSICS LETTERS, 2013, 102 (14)

← 1 2 3 4 5 →