Surface plasmon leakage radiation microscopy at the diffraction limit

被引：75

作者：

Hohenau, A. ^{[1
]}

Krenn, J. R. ^{[1
]}

Drezet, A. ^{[2
]}

Mollet, O. ^{[2
]}

Huant, S. ^{[2
]}

Genet, C. ^{[3
,4
]}

Stein, B. ^{[3
,4
]}

Ebbesen, T. W. ^{[3
,4
]}

机构：

[1] Karl Franzens Univ Graz, Inst Phys, A-8010 Graz, Austria

[2] Inst Neel CNRS UJF, F-38042 Grenoble, France

[3] Univ Strasbourg, ISIS, F-67000 Strasbourg, France

[4] CNRS, F-67000 Strasbourg, France

来源：

OPTICS EXPRESS | 2011年 / 19卷 / 25期

基金：

奥地利科学基金会;

关键词：

COUPLED EMISSION; NEAR-FIELD; POLARITON; IMAGE; GOLD;

D O I：

10.1364/OE.19.025749

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

This paper describes the image formation process in optical leakage radiation microscopy of surface plasmon-polaritons with diffraction limited spatial resolution. The comparison of experimentally recorded images with simulations of point-like surface plasmon-polariton emitters allows for an assignment of the observed fringe patterns. A simple formula for the prediction of the fringe periodicity is presented and practically relevant effects of abberations in the imaging system are discussed. (C) 2011 Optical Society of America

引用

页码：25749 / 25762

页数：14

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