Thickness effect on the properties of BaTiO3-CoFe2O4 multilayer thin films prepared by chemical solution deposition

被引：37
|
作者：
Dai, Y. Q. [1 ]
Dai, J. M. [1 ]
Tang, X. W. [1 ]
Zhang, K. J. [1 ]
Zhu, X. B. [1 ]
Yang, J. [1 ]
Sun, Y. P. [1 ,2 ]
机构：
[1] Chinese Acad Sci, Inst Solid State Phys, Key Lab Mat Phys, Hefei 230031, Peoples R China
[2] Chinese Acad Sci, High Field Magnet Lab, Hefei 230031, Peoples R China
来源：
JOURNAL OF ALLOYS AND COMPOUNDS | 2014年 / 587卷
基金：
美国国家科学基金会;
关键词：
Multilayer thin films; BaTiO3-CoFe2O4; Thickness effect; Chemical solution deposition; Multiferroics; ELECTRICAL-PROPERTIES; LEAKAGE CURRENT; SOL-GEL; SIZE; NANOSTRUCTURES; DEPENDENCE; BATIO3;
D O I：
10.1016/j.jallcom.2013.11.026
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
BaTiO3-CoFe2O4 multilayer thin films with different thickness were fabricated by chemical solution deposition. The thickness effect on the multilayer films properties was investigated. As a result, the strain in the films is relaxed and the mean grain size is increased with increasing films thickness. Some microcracks are generated due to the large thermal expansion coefficient misfit and exert a significant impact on the films properties. Dielectric constant and saturation polarization increase with the films thickness. A decrease in saturation magnetization of the thickest film is observed and attributed to the pinning effect of the microcracks to the domain wall movement. The variation of magnetodielectric effect is analyzed and attributed to the combined effect of the magnetoresistance effect and Maxwell-Wagner effect. Finally, the results indicate that the optimal thickness of the BTO-CFO multilayer films via CSD method is about 500 nm. (C) 2013 Elsevier B. V. All rights reserved.
引用
收藏
页码：681 / 687
页数：7
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