Refractive-index measurement of gradient-index microlenses by diffraction tomography

被引：8
|
作者：
Singer, W
Dobler, B
Schreiber, H
Brenner, KH
Messerschmidt, B
机构：
[1] FRAUNHOFER EINRIGHTUNG ANGEW OPT & FEINMECH, D-07743 JENA, GERMANY
[2] UNIV STUTTGART, INST TECH OPT, W-7000 STUTTGART, GERMANY
[3] UNIV MANNHEIM, LEHRSTUHL OPTOELEKTR, MANNHEIM, GERMANY
来源：
APPLIED OPTICS | 1996年 / 35卷 / 13期
关键词：
tomography; gradient index; microlenses; refractive index; interferometry;
D O I：
10.1364/AO.35.002167
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
Diffraction tomography is applied to reconstruction of the gradient-index distribution of planar gradient-index microlenses, fabricated by thermal ion exchange. Measurements of the single-phase projections are performed by phase-shifting interferometry. For reconstruction, the Rytov approximation for smooth inhomogeneities is applied. Results are compared with measurement results from other methods and simulation results. (C) 1996 Optical Society of America
引用
收藏
页码：2167 / 2171
页数：5
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