Refractive-index measurement of gradient-index microlenses by diffraction tomography

被引：8
|
作者：
Singer, W
Dobler, B
Schreiber, H
Brenner, KH
Messerschmidt, B
机构：
[1] FRAUNHOFER EINRIGHTUNG ANGEW OPT & FEINMECH, D-07743 JENA, GERMANY
[2] UNIV STUTTGART, INST TECH OPT, W-7000 STUTTGART, GERMANY
[3] UNIV MANNHEIM, LEHRSTUHL OPTOELEKTR, MANNHEIM, GERMANY
来源：
APPLIED OPTICS | 1996年 / 35卷 / 13期
关键词：
tomography; gradient index; microlenses; refractive index; interferometry;
D O I：
10.1364/AO.35.002167
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
Diffraction tomography is applied to reconstruction of the gradient-index distribution of planar gradient-index microlenses, fabricated by thermal ion exchange. Measurements of the single-phase projections are performed by phase-shifting interferometry. For reconstruction, the Rytov approximation for smooth inhomogeneities is applied. Results are compared with measurement results from other methods and simulation results. (C) 1996 Optical Society of America
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页码：2167 / 2171
页数：5
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