共 50 条
- [41] Advanced patterning approaches based on negative tone development (NTD) process for further extension of 193 nm immersion lithographyADVANCES IN PATTERNING MATERIALS AND PROCESSES XXXII, 2015, 9425Shirakawa, Michihiro论文数: 0 引用数: 0 h-index: 0机构: Elect Mat Res Labs, Res & Dev Management Headquarters, Yoshida, Shizuoka 4210396, Japan Elect Mat Res Labs, Res & Dev Management Headquarters, Yoshida, Shizuoka 4210396, JapanInoue, Naoki论文数: 0 引用数: 0 h-index: 0机构: Elect Mat Res Labs, Res & Dev Management Headquarters, Yoshida, Shizuoka 4210396, Japan Elect Mat Res Labs, Res & Dev Management Headquarters, Yoshida, Shizuoka 4210396, JapanFurutani, Hajime论文数: 0 引用数: 0 h-index: 0机构: Elect Mat Res Labs, Res & Dev Management Headquarters, Yoshida, Shizuoka 4210396, Japan Elect Mat Res Labs, Res & Dev Management Headquarters, Yoshida, Shizuoka 4210396, JapanYamamoto, Kei论文数: 0 引用数: 0 h-index: 0机构: Elect Mat Res Labs, Res & Dev Management Headquarters, Yoshida, Shizuoka 4210396, Japan Elect Mat Res Labs, Res & Dev Management Headquarters, Yoshida, Shizuoka 4210396, JapanGoto, Akiyoshi论文数: 0 引用数: 0 h-index: 0机构: Synthet Organ Chem Labs, Res & Dev Management Headquarters, Yoshida, Shizuoka 4210396, Japan Elect Mat Res Labs, Res & Dev Management Headquarters, Yoshida, Shizuoka 4210396, JapanFujita, Mitsuhiro论文数: 0 引用数: 0 h-index: 0机构: Anal Technol Ctr, Res & Dev Management Headquarters, Minamiashigara, Kanagawa 2500193, Japan Elect Mat Res Labs, Res & Dev Management Headquarters, Yoshida, Shizuoka 4210396, Japan
- [42] KINETIC OF ELECTROPHOTOGRAPHIC HALF-TONE DEVELOPMENT BY NEGATIVE TYPE PROCESS WITH ZNO-BINDER LAYERS AND LIQUID DEVELOPERJOURNAL FUR SIGNALAUFZEICHNUNGSMATERIALIEN, 1977, 5 (02): : 93 - 102SCHLEUSENER, M论文数: 0 引用数: 0 h-index: 0机构: TH OTTO VON GUERICKE,BEREICH EXPTL PHYS,SEKT MATH & PHYS,DDR-301 MAGDEBURG,GER DEM REP TH OTTO VON GUERICKE,BEREICH EXPTL PHYS,SEKT MATH & PHYS,DDR-301 MAGDEBURG,GER DEM REP
- [43] CD Uniformity Improvement of Dense Contact Array in Negative Tone Development ProcessMETROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XXIX, 2015, 9424Tsai, Fengnien论文数: 0 引用数: 0 h-index: 0机构: Macronix Int Co Ltd, Technol Dev Ctr, Hsinchu 300, Taiwan Macronix Int Co Ltd, Technol Dev Ctr, Hsinchu 300, TaiwanYeh, Teng-hao论文数: 0 引用数: 0 h-index: 0机构: Macronix Int Co Ltd, Technol Dev Ctr, Hsinchu 300, Taiwan Macronix Int Co Ltd, Technol Dev Ctr, Hsinchu 300, TaiwanYang, C. C.论文数: 0 引用数: 0 h-index: 0机构: Macronix Int Co Ltd, Technol Dev Ctr, Hsinchu 300, Taiwan Macronix Int Co Ltd, Technol Dev Ctr, Hsinchu 300, TaiwanYang, Elvis论文数: 0 引用数: 0 h-index: 0机构: Macronix Int Co Ltd, Technol Dev Ctr, Hsinchu 300, Taiwan Macronix Int Co Ltd, Technol Dev Ctr, Hsinchu 300, TaiwanYang, T. H.论文数: 0 引用数: 0 h-index: 0机构: Macronix Int Co Ltd, Technol Dev Ctr, Hsinchu 300, Taiwan Macronix Int Co Ltd, Technol Dev Ctr, Hsinchu 300, TaiwanChen, K. C.论文数: 0 引用数: 0 h-index: 0机构: Macronix Int Co Ltd, Technol Dev Ctr, Hsinchu 300, Taiwan Macronix Int Co Ltd, Technol Dev Ctr, Hsinchu 300, Taiwan
- [44] Developer effect on the negative tone development process under low NILS conditionsADVANCES IN RESIST MATERIALS AND PROCESSING TECHNOLOGY XXVIII, 2011, 7972Bae, Young C.论文数: 0 引用数: 0 h-index: 0机构: Dow Chem Co USA, Dow Elect Mat, Marlborough, MA 01752 USA Dow Chem Co USA, Dow Elect Mat, Marlborough, MA 01752 USALee, Seung-Hyun论文数: 0 引用数: 0 h-index: 0机构: Dow Chem Co USA, Dow Elect Mat, Marlborough, MA 01752 USA Dow Chem Co USA, Dow Elect Mat, Marlborough, MA 01752 USABell, Rosemary论文数: 0 引用数: 0 h-index: 0机构: Dow Chem Co USA, Dow Elect Mat, Marlborough, MA 01752 USA Dow Chem Co USA, Dow Elect Mat, Marlborough, MA 01752 USAJoesten, Lori论文数: 0 引用数: 0 h-index: 0机构: Dow Chem Co USA, Dow Elect Mat, Marlborough, MA 01752 USA Dow Chem Co USA, Dow Elect Mat, Marlborough, MA 01752 USABarclay, George G.论文数: 0 引用数: 0 h-index: 0机构: Dow Chem Co USA, Dow Elect Mat, Marlborough, MA 01752 USA Dow Chem Co USA, Dow Elect Mat, Marlborough, MA 01752 USA
- [45] CMP process development for the via-middle 3D TSV applications at 28 nm technology nodeMICROELECTRONIC ENGINEERING, 2012, 92 : 29 - 33Tsai, T. C.论文数: 0 引用数: 0 h-index: 0机构: United Microelect Corp, Adv Technol Dev Div, Tainan, Taiwan United Microelect Corp, Adv Technol Dev Div, Tainan, TaiwanTsao, W. C.论文数: 0 引用数: 0 h-index: 0机构: United Microelect Corp, Adv Technol Dev Div, Tainan, Taiwan United Microelect Corp, Adv Technol Dev Div, Tainan, TaiwanLin, Welch论文数: 0 引用数: 0 h-index: 0机构: United Microelect Corp, Adv Technol Dev Div, Tainan, Taiwan United Microelect Corp, Adv Technol Dev Div, Tainan, TaiwanHsu, C. L.论文数: 0 引用数: 0 h-index: 0机构: United Microelect Corp, Adv Technol Dev Div, Tainan, Taiwan United Microelect Corp, Adv Technol Dev Div, Tainan, TaiwanLin, C. L.论文数: 0 引用数: 0 h-index: 0机构: United Microelect Corp, Adv Technol Dev Div, Tainan, Taiwan United Microelect Corp, Adv Technol Dev Div, Tainan, TaiwanHsu, C. M.论文数: 0 引用数: 0 h-index: 0机构: United Microelect Corp, Adv Technol Dev Div, Tainan, Taiwan United Microelect Corp, Adv Technol Dev Div, Tainan, TaiwanLin, J. F.论文数: 0 引用数: 0 h-index: 0机构: United Microelect Corp, Adv Technol Dev Div, Tainan, Taiwan United Microelect Corp, Adv Technol Dev Div, Tainan, TaiwanHuang, C. C.论文数: 0 引用数: 0 h-index: 0机构: United Microelect Corp, Adv Technol Dev Div, Tainan, Taiwan United Microelect Corp, Adv Technol Dev Div, Tainan, TaiwanWu, J. Y.论文数: 0 引用数: 0 h-index: 0机构: United Microelect Corp, Adv Technol Dev Div, Tainan, Taiwan United Microelect Corp, Adv Technol Dev Div, Tainan, Taiwan
- [46] Necessity of resist model in source mask optimization for negative tone development processJOURNAL OF MICRO-NANOLITHOGRAPHY MEMS AND MOEMS, 2017, 16 (03):Zhao, Lijun论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Inst Microelect, Key Lab Microelect Devices & Integrated Technol, Beijing, Peoples R China Univ Chinese Acad Sci, Beijing, Peoples R China Chinese Acad Sci, Inst Microelect, Key Lab Microelect Devices & Integrated Technol, Beijing, Peoples R ChinaDong, Lisong论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Inst Microelect, Key Lab Microelect Devices & Integrated Technol, Beijing, Peoples R China Chinese Acad Sci, Inst Microelect, Key Lab Microelect Devices & Integrated Technol, Beijing, Peoples R ChinaChen, Wenhui论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Inst Microelect, Key Lab Microelect Devices & Integrated Technol, Beijing, Peoples R China Chinese Acad Sci, Inst Microelect, Key Lab Microelect Devices & Integrated Technol, Beijing, Peoples R ChinaWei, Yayi论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Inst Microelect, Key Lab Microelect Devices & Integrated Technol, Beijing, Peoples R China Univ Chinese Acad Sci, Beijing, Peoples R China Chinese Acad Sci, Inst Microelect, Key Lab Microelect Devices & Integrated Technol, Beijing, Peoples R ChinaYe, Tianchun论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Inst Microelect, Key Lab Microelect Devices & Integrated Technol, Beijing, Peoples R China Univ Chinese Acad Sci, Beijing, Peoples R China Chinese Acad Sci, Inst Microelect, Key Lab Microelect Devices & Integrated Technol, Beijing, Peoples R ChinaYue, Liwan论文数: 0 引用数: 0 h-index: 0机构: SMIC Adv Technol R&D Shanghai Corp, Shanghai, Peoples R China Chinese Acad Sci, Inst Microelect, Key Lab Microelect Devices & Integrated Technol, Beijing, Peoples R ChinaJiang, Yuntao论文数: 0 引用数: 0 h-index: 0机构: SMIC Adv Technol R&D Shanghai Corp, Shanghai, Peoples R China Chinese Acad Sci, Inst Microelect, Key Lab Microelect Devices & Integrated Technol, Beijing, Peoples R ChinaWu, Qiang论文数: 0 引用数: 0 h-index: 0机构: SMIC Adv Technol R&D Shanghai Corp, Shanghai, Peoples R China Chinese Acad Sci, Inst Microelect, Key Lab Microelect Devices & Integrated Technol, Beijing, Peoples R China
- [47] ArF photoresist polymers with nitrogen or sulfone moieties for negative tone development processADVANCES IN PATTERNING MATERIALS AND PROCESSES XXXI, 2014, 9051Kim, Dong-Gyun论文数: 0 引用数: 0 h-index: 0机构: Seoul Natl Univ, Sch Chem & Biol Engn, 599 Gwanak Ro, Seoul 151742, South Korea Seoul Natl Univ, Sch Chem & Biol Engn, 599 Gwanak Ro, Seoul 151742, South KoreaKwon, Su-Jee论文数: 0 引用数: 0 h-index: 0机构: Seoul Natl Univ, Sch Chem & Biol Engn, 599 Gwanak Ro, Seoul 151742, South Korea Seoul Natl Univ, Sch Chem & Biol Engn, 599 Gwanak Ro, Seoul 151742, South KoreaHong, Suk-Koo论文数: 0 引用数: 0 h-index: 0机构: Samsung Elect Co Ltd, Semicond R&D Ctr, Gyeonggi 445931, South Korea Seoul Natl Univ, Sch Chem & Biol Engn, 599 Gwanak Ro, Seoul 151742, South KoreaLee, Joon Je论文数: 0 引用数: 0 h-index: 0机构: Samsung Elect Co Ltd, Semicond R&D Ctr, Gyeonggi 445931, South Korea Seoul Natl Univ, Sch Chem & Biol Engn, 599 Gwanak Ro, Seoul 151742, South KoreaLee, Hyung Rae论文数: 0 引用数: 0 h-index: 0机构: Samsung Elect Co Ltd, Semicond R&D Ctr, Gyeonggi 445931, South Korea Seoul Natl Univ, Sch Chem & Biol Engn, 599 Gwanak Ro, Seoul 151742, South KoreaYun, Hyo Jin论文数: 0 引用数: 0 h-index: 0机构: Samsung Elect Co Ltd, Semicond R&D Ctr, Gyeonggi 445931, South Korea Seoul Natl Univ, Sch Chem & Biol Engn, 599 Gwanak Ro, Seoul 151742, South KoreaBaik, Ji-Hoon论文数: 0 引用数: 0 h-index: 0机构: Seoul Natl Univ, Sch Chem & Biol Engn, 599 Gwanak Ro, Seoul 151742, South Korea Seoul Natl Univ, Sch Chem & Biol Engn, 599 Gwanak Ro, Seoul 151742, South KoreaIm, Dohyuk论文数: 0 引用数: 0 h-index: 0机构: Dongjin Semichem Co Ltd, Electromaterial Business Div, Gyeonggi 445931, South Korea Seoul Natl Univ, Sch Chem & Biol Engn, 599 Gwanak Ro, Seoul 151742, South KoreaJang, Eujean论文数: 0 引用数: 0 h-index: 0机构: Dongjin Semichem Co Ltd, Electromaterial Business Div, Gyeonggi 445931, South Korea Seoul Natl Univ, Sch Chem & Biol Engn, 599 Gwanak Ro, Seoul 151742, South KoreaLee, Jae-Woo论文数: 0 引用数: 0 h-index: 0机构: Dongjin Semichem Co Ltd, Electromaterial Business Div, Gyeonggi 445931, South Korea Seoul Natl Univ, Sch Chem & Biol Engn, 599 Gwanak Ro, Seoul 151742, South KoreaKim, Jae-Hyun论文数: 0 引用数: 0 h-index: 0机构: Dongjin Semichem Co Ltd, Electromaterial Business Div, Gyeonggi 445931, South Korea Seoul Natl Univ, Sch Chem & Biol Engn, 599 Gwanak Ro, Seoul 151742, South KoreaLee, Jong-Chan论文数: 0 引用数: 0 h-index: 0机构: Seoul Natl Univ, Sch Chem & Biol Engn, 599 Gwanak Ro, Seoul 151742, South Korea Seoul Natl Univ, Sch Chem & Biol Engn, 599 Gwanak Ro, Seoul 151742, South Korea
- [48] Process Variation Challenges and Resolution in the Negative Tone Develop Double Patterning for 20 nm and Below Technology NodeADVANCES IN PATTERNING MATERIALS AND PROCESSES XXXII, 2015, 9425Mehta, Sohan S.论文数: 0 引用数: 0 h-index: 0机构: GLOBALFOUNDRIES Inc, Salt Lake City, UT 84124 USA GLOBALFOUNDRIES Inc, Salt Lake City, UT 84124 USAGanta, Lakshmi K.论文数: 0 引用数: 0 h-index: 0机构: GLOBALFOUNDRIES Inc, Salt Lake City, UT 84124 USA GLOBALFOUNDRIES Inc, Salt Lake City, UT 84124 USAChauhan, Vikrant论文数: 0 引用数: 0 h-index: 0机构: GLOBALFOUNDRIES Inc, Salt Lake City, UT 84124 USA GLOBALFOUNDRIES Inc, Salt Lake City, UT 84124 USAWu, Yixu论文数: 0 引用数: 0 h-index: 0机构: GLOBALFOUNDRIES Inc, Salt Lake City, UT 84124 USA GLOBALFOUNDRIES Inc, Salt Lake City, UT 84124 USASingh, Sunil论文数: 0 引用数: 0 h-index: 0机构: GLOBALFOUNDRIES Inc, Salt Lake City, UT 84124 USA GLOBALFOUNDRIES Inc, Salt Lake City, UT 84124 USAAnn, Chia论文数: 0 引用数: 0 h-index: 0机构: GLOBALFOUNDRIES Inc, Salt Lake City, UT 84124 USA GLOBALFOUNDRIES Inc, Salt Lake City, UT 84124 USASubramany, Lokesh论文数: 0 引用数: 0 h-index: 0机构: GLOBALFOUNDRIES Inc, Salt Lake City, UT 84124 USA GLOBALFOUNDRIES Inc, Salt Lake City, UT 84124 USAHiggins, Craig论文数: 0 引用数: 0 h-index: 0机构: GLOBALFOUNDRIES Inc, Salt Lake City, UT 84124 USA GLOBALFOUNDRIES Inc, Salt Lake City, UT 84124 USAErenturk, Burcin论文数: 0 引用数: 0 h-index: 0机构: GLOBALFOUNDRIES Inc, Salt Lake City, UT 84124 USA GLOBALFOUNDRIES Inc, Salt Lake City, UT 84124 USASrivastava, Ravi论文数: 0 引用数: 0 h-index: 0机构: GLOBALFOUNDRIES Inc, Salt Lake City, UT 84124 USA GLOBALFOUNDRIES Inc, Salt Lake City, UT 84124 USASingh, Paramjit论文数: 0 引用数: 0 h-index: 0机构: GLOBALFOUNDRIES Inc, Salt Lake City, UT 84124 USA GLOBALFOUNDRIES Inc, Salt Lake City, UT 84124 USAKoh, Hui Peng论文数: 0 引用数: 0 h-index: 0机构: GLOBALFOUNDRIES Inc, Salt Lake City, UT 84124 USA GLOBALFOUNDRIES Inc, Salt Lake City, UT 84124 USACho, David论文数: 0 引用数: 0 h-index: 0机构: GLOBALFOUNDRIES Inc, Salt Lake City, UT 84124 USA GLOBALFOUNDRIES Inc, Salt Lake City, UT 84124 USA
- [49] Process flow development and integration of porous low k for 45 nm nodeADVANCED METALLIZATION CONFERENCE 2007 (AMC 2007), 2008, 23 : 371 - 377Naik, Mehul论文数: 0 引用数: 0 h-index: 0机构: Appl Mat Inc, Santa Clara, CA 95054 USA Appl Mat Inc, Santa Clara, CA 95054 USADai, Huixiong论文数: 0 引用数: 0 h-index: 0机构: Appl Mat Inc, Santa Clara, CA 95054 USA Appl Mat Inc, Santa Clara, CA 95054 USAOrdonio, Christopher论文数: 0 引用数: 0 h-index: 0机构: Appl Mat Inc, Santa Clara, CA 95054 USA Appl Mat Inc, Santa Clara, CA 95054 USAYoshida, Naomi论文数: 0 引用数: 0 h-index: 0机构: Appl Mat Inc, Santa Clara, CA 95054 USA Appl Mat Inc, Santa Clara, CA 95054 USANguyen, Phong论文数: 0 引用数: 0 h-index: 0机构: Appl Mat Inc, Santa Clara, CA 95054 USA Appl Mat Inc, Santa Clara, CA 95054 USAFang, Hongbin论文数: 0 引用数: 0 h-index: 0机构: Appl Mat Inc, Santa Clara, CA 95054 USA Appl Mat Inc, Santa Clara, CA 95054 USALi, Andrew论文数: 0 引用数: 0 h-index: 0机构: Appl Mat Inc, Santa Clara, CA 95054 USA Appl Mat Inc, Santa Clara, CA 95054 USAYang, Hsien-Lung论文数: 0 引用数: 0 h-index: 0机构: Appl Mat Inc, Santa Clara, CA 95054 USA Appl Mat Inc, Santa Clara, CA 95054 USAYu, Jick论文数: 0 引用数: 0 h-index: 0机构: Appl Mat Inc, Santa Clara, CA 95054 USA Appl Mat Inc, Santa Clara, CA 95054 USADemos, Alex论文数: 0 引用数: 0 h-index: 0机构: Appl Mat Inc, Santa Clara, CA 95054 USA Appl Mat Inc, Santa Clara, CA 95054 USAOkazaki, Motoya论文数: 0 引用数: 0 h-index: 0机构: Appl Mat Inc, Santa Clara, CA 95054 USA Appl Mat Inc, Santa Clara, CA 95054 USAThothadri, Mani论文数: 0 引用数: 0 h-index: 0机构: Appl Mat Inc, Santa Clara, CA 95054 USA Appl Mat Inc, Santa Clara, CA 95054 USAArmacost, Michael论文数: 0 引用数: 0 h-index: 0机构: Appl Mat Inc, Santa Clara, CA 95054 USA Appl Mat Inc, Santa Clara, CA 95054 USANgai, Chris论文数: 0 引用数: 0 h-index: 0机构: Appl Mat Inc, Santa Clara, CA 95054 USA Appl Mat Inc, Santa Clara, CA 95054 USAMacwilliams, Kenneth论文数: 0 引用数: 0 h-index: 0机构: Appl Mat Inc, Santa Clara, CA 95054 USA Appl Mat Inc, Santa Clara, CA 95054 USA
- [50] THE PROBLEMS AND SOLUTIONS IN 40 NM NODE DUAL GATE LITHOGRAPHY PROCESS DEVELOPMENT2015 China Semiconductor Technology International Conference, 2015,Li Dan论文数: 0 引用数: 0 h-index: 0机构: Shanghai Huali Microelect Corp, Dept Res & Dev, Shanghai 201203, Peoples R China Shanghai Huali Microelect Corp, Dept Res & Dev, Shanghai 201203, Peoples R ChinaGan Zhifeng论文数: 0 引用数: 0 h-index: 0机构: Shanghai Huali Microelect Corp, Dept Res & Dev, Shanghai 201203, Peoples R China Shanghai Huali Microelect Corp, Dept Res & Dev, Shanghai 201203, Peoples R ChinaWang Yanyun论文数: 0 引用数: 0 h-index: 0机构: Shanghai Huali Microelect Corp, Dept Res & Dev, Shanghai 201203, Peoples R China Shanghai Huali Microelect Corp, Dept Res & Dev, Shanghai 201203, Peoples R ChinaYang Zhengkai论文数: 0 引用数: 0 h-index: 0机构: Shanghai Huali Microelect Corp, Dept Res & Dev, Shanghai 201203, Peoples R China Shanghai Huali Microelect Corp, Dept Res & Dev, Shanghai 201203, Peoples R ChinaMao Zhibiao论文数: 0 引用数: 0 h-index: 0机构: Shanghai Huali Microelect Corp, Dept Res & Dev, Shanghai 201203, Peoples R China Shanghai Huali Microelect Corp, Dept Res & Dev, Shanghai 201203, Peoples R ChinaZhang Yu论文数: 0 引用数: 0 h-index: 0机构: Shanghai Huali Microelect Corp, Dept Res & Dev, Shanghai 201203, Peoples R China Shanghai Huali Microelect Corp, Dept Res & Dev, Shanghai 201203, Peoples R China