Improving test quality using test data compression

被引：0
|
作者：
Mukherjee, N [1 ]
机构：
[1] Mentor Graph Corp, Wilsonville, OR 97070 USA
来源：
14TH ASIAN TEST SYMPOSIUM, PROCEEDINGS | 2005年
关键词：
D O I：
10.1109/ATS.2005.70
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：463 / 463
页数：1
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