共 50 条
- [42] Basic Concepts in Mathematical Models of Metrology Measurement Techniques, 2001, 44 : 341 - 352
- [43] Basic concept of feature based metrology Seimitsu Kogaku Kaishi/Journal of the Japan Society for Precision Engineering, 1998, 64 (01): : 94 - 98
- [44] Holographic interferometry deformations metrology by using AR modelling OPTICAL MICRO- AND NANOMETROLOGY IN MANUFACTURING TECHNOLOGY, 2004, 5458 : 136 - 140
- [45] USE OF HOLOGRAPHIC OPTICAL-ELEMENTS IN SPECKLE METROLOGY APPLIED OPTICS, 1984, 23 (24): : 4592 - 4595
- [46] Holographic metrology for study and evaluation of vibration in complex structures IMAGING SCIENCE JOURNAL, 2008, 56 (02): : 107 - 112
- [47] Holographic photorefractive images storage for applied metrology by interferometry IUTAM SYMPOSIUM ON ADVANCED OPTICAL METHODS AND APPLICATIONS IN SOLID MECHANICS, 2000, 82 : 385 - 399
- [48] Holographic principles in antenna metrology at millimeter and submillimeter wavelengths 2015 9th European Conference on Antennas and Propagation (EuCAP), 2015,
- [49] Localized recording approaches and phase metrology for holographic storage OPTICAL DATA STORAGE 2007, 2007, 6620
- [50] HOLOGRAPHIC PROJECTION OF SPECKLE PATTERNS APPLIED TO REMOTE METROLOGY JOURNAL OF OPTICS-NOUVELLE REVUE D OPTIQUE, 1979, 10 (05): : 245 - 249