Advanced Fault Isolation Technique Using Electro-optical Terahertz Pulse Reflectometry

被引：0

作者：

Tay, M. Y. ^{[1
]}

Cao, L. ^{[2
]}

Venkata, M. ^{[2
]}

Tran, L. ^{[2
]}

Donna, W. ^{[2
]}

Qiu, W. ^{[1
]}

Alton, J. ^{[3
]}

Taday, P. F. ^{[3
]}

Lin, M. ^{[4
]}

机构：

[1] Adv Micro Devices Singapore Pte Ltd, 508 Chai Chee Lane, Singapore 469032, Singapore

[2] Adv Micro Devices Austin, Austin, TX 78735 USA

[3] TeraView Ltd, Cambridge CB4 0DS, England

[4] Hermes Epitek Corp, Hsinchu 300, Taiwan

来源：

2012 19TH IEEE INTERNATIONAL SYMPOSIUM ON THE PHYSICAL AND FAILURE ANALYSIS OF INTEGRATED CIRCUITS (IPFA) | 2012年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Electro-optical terahertz pulse reflectometry (EOTPR) was introduced recently to isolate faults in advanced IC packages. The EOTPR system provides 10 mu m in distance accuracy that can be used to localize package-level open and short failures non-destructively. In this paper, an EOTPR system was used to determine the location of open and short failures and to identify impedance variations in a series of package substrates. The experimental results demonstrate the higher accuracy of the EOTPR system in determining the distance to defect compared to traditional time-domain reflectometry systems. Finally, physical failure analysis was used to verify the accuracy of the EOTPR results.

引用

页数：5

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