Stub Swapping in Automatic Three-Stub Impedance Matching Systems

被引：0
|
作者：
Bilik, Vladimir [1 ]
机构：
[1] Slovak Univ Technol Bratislava, Fac Elect Engn & Informat Technol, Bratislava, Slovakia
来源：
PROCEEDINGS OF 13TH CONFERENCE ON MICROWAVE TECHNIQUES (COMITE 2013) | 2013年
关键词：
impedance matching; autotuners; stub swapping; industrial electronics;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The paper explains the nature of the stub swapping phenomenon in three-stub automatic impedance matching systems and points out problems it causes in high-power industrial autotuners. A method of quantifying consequences of stub swapping is proposed and illustrated by a simulation example. Two possible ways of suppressing the adverse effects of the stub swapping are suggested.
引用
收藏
页码：192 / 196
页数：5
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