Interfacial Reactions of Sn, Sn-3.0Ag-0.5Cu, and Sn-9Zn Lead-Free Solders with Fe-42Ni Substrates

被引:15
|
作者
Yen, Yee-Wen [1 ]
Hsieh, Yu-Ping [1 ]
Jao, Chien-Chung [2 ]
Chiu, Chao-Wei [1 ]
Li, Yi-Shan [1 ]
机构
[1] Natl Taiwan Univ Sci & Technol, Dept Mat Sci & Engn, Taipei 106, Taiwan
[2] Ta Hwa Inst Technol, Dept Appl Technol Living, Hsinchu 30703, Taiwan
关键词
Sn; Sn-3.0 wt.%Ag-0.5 wt.%Cu (SAC); Sn-9 wt.%Zn (SZ) Fe-42 wt.%Ni (alloy 42); diffusion-controlled; PB-FREE SOLDERS; THERMODYNAMIC ASSESSMENT; GROWTH-KINETICS; ZN SYSTEM; NI; ALLOYS; AG; CU;
D O I
10.1007/s11664-013-2727-4
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Interfacial reactions between Sn, Sn-3.0 wt.%Ag-0.5 wt.%Cu (SAC), and Sn-9 wt.%Zn (SZ) lead-free solders and Fe-42 wt.%Ni (alloy 42) substrates at 240A degrees C, 255A degrees C, and 270A degrees C were investigated in this study. FeSn2, (Fe,Ni, Cu)Sn-2, and (Ni,Fe)(5)Zn-21 phases were formed, respectively, at the interface in the Sn/alloy 42, SAC/alloy 42, and SZ/alloy 42 couples. As the reaction time and temperature were increased, the layered intermetallic compound (IMC) assumed two distinct structures, i.e., a thicker layer and a pillar-shaped IMC, in all couples. The IMC thickness of these couples increased with the increase of reaction time and temperature. The IMC thickness was also proportional to the square root of the reaction time. The interfacial reaction mechanism of these couples was diffusion controlled.
引用
收藏
页码:187 / 194
页数:8
相关论文
共 50 条
  • [41] Study of cooling rate on lead-free soldering microstructure of Sn-3.0Ag-0.5Cu solder
    Hu, Q
    Lee, ZS
    Zhao, ZL
    Lee, DL
    2005 International Conference on Asian Green Electronics: Design for Manufacturability and Reliability, Proceedings, 2004, : 156 - 160
  • [42] Creep rupture of lead-free Sn-3.5Ag and Sn-3.5Ag-0.5Cu solders
    Chih-Kuang Lin
    De-You Chu
    Journal of Materials Science: Materials in Electronics, 2005, 16 : 355 - 365
  • [43] Creep rupture of lead-free Sn-3.5Ag and Sn-3.5Ag-0.5Cu solders
    Lin, CK
    Chu, DY
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2005, 16 (06) : 355 - 365
  • [44] Microstructure and properties of Sn1.0Ag0.5Cu and Sn3.0Ag0.5Cu lead-free solder
    School of Mechanical and Electrical Engineering, Jiangsu Normal University, Xuzhou
    221116, China
    不详
    450001, China
    Xiyou Jinshu, 7 (589-593):
  • [45] Interfacial Reactions of Si Die Attachment with Zn-Sn and Au-20Sn High Temperature Lead-Free Solders on Cu Substrates
    Kim, Seongjun
    Kim, Keun-Soo
    Suganuma, Katsuaki
    Izuta, Goro
    JOURNAL OF ELECTRONIC MATERIALS, 2009, 38 (06) : 873 - 883
  • [46] Interfacial Reactions of Si Die Attachment with Zn-Sn and Au-20Sn High Temperature Lead-Free Solders on Cu Substrates
    Seongjun Kim
    Keun-Soo Kim
    Katsuaki Suganuma
    Goro Izuta
    Journal of Electronic Materials, 2009, 38 : 873 - 883
  • [47] The Effect of Eutectic Structure on the Creep Properties of Sn-3.0Ag-0.5Cu and Sn-8.0Sb-3.0Ag Solders
    Park, Yujin
    Bang, Jung-Hwan
    Oh, Chul Min
    Hong, Won Sik
    Kang, Namhyun
    METALS, 2017, 7 (12):
  • [48] Effect of Ag on Sn-Cu and Sn-Zn lead free solders
    Alam, S. N.
    Mishra, Prerna
    Kumar, Rajnish
    MATERIALS SCIENCE-POLAND, 2015, 33 (02) : 317 - 330
  • [49] Cross-solder interaction on interfacial reactions in Ni/Sn-3.0Ag-0.5Cu/Cu solder interconnects
    Fan, M.
    Huang, M. L.
    Zhao, N.
    2016 17TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT), 2016, : 542 - 545
  • [50] Effects of Ni addition on Microstructure and the Shear Strength of Sn-3.0Ag-0.5Cu/Cu Solders Joints
    Wang, Lifeng
    Shen, Xuwei
    Sun, Fenglian
    Liu, Yang
    2008 INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY & HIGH DENSITY PACKAGING, VOLS 1 AND 2, 2008, : 783 - 787