Removal mechanisms of micro-scale particles by surface wave in laser cleaning

被引:13
|
作者
Hsu, SC [1 ]
Lin, JM [1 ]
机构
[1] Natl Chung Cheng Univ, Dept Mech Engn, Tainan 701, Taiwan
来源
OPTICS AND LASER TECHNOLOGY | 2006年 / 38卷 / 07期
关键词
laser cleaning; surface elastic wave; particle; finite element simulation;
D O I
10.1016/j.optlastec.2004.11.021
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
This paper is to investigate the mechanisms of micro-scale particle removal by surface wave, which was induced by a short pulse laser in a cleaning process. The authors analyzed the adhesive forces of particles on substrate surface and the clearance force produced by surface wave in laser cleaning. The physical model of particle removal by laser-induced surface wave was established to predict the removal area and the processing conditions of laser cleaning. In this research, a KrF excimer laser was applied to irradiate 304 stainless steel specimen distributed with copper particles (< 45 mu m) to generate surface wave for copper particle removal. Considering that a time-varying and uniformly distributed heat source irradiates on material surface with thermao-elastic behavior, the displacement and acceleration of substrate induced by a pulsed laser were solved by an uncoupled thermal-mechanical analysis based on the finite element method. The processing parameters such as laser energy, laser spot size are discussed, respectively. A series of laser cleaning experiments were designed to compare with computation results. The results show that the removal area by surface wave beyond the laser spot increases with the laser energy and that, the surface acceleration decreases with the increase of the laser spot size. (c) 2005 Elsevier Ltd. All rights reserved.
引用
收藏
页码:544 / 551
页数:8
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