Palladium-based trench gate MOSFET for highly sensitive hydrogen gas sensor

被引:36
|
作者
Kumar, Ajay [1 ]
机构
[1] Jaypee Inst Informat Technol, Elect & Commun Engn Dept, Noida, India
关键词
Hydrogen; Gas sensor; MOSFET; Palladium; Sensitivity; RECESSED CHANNEL MOSFET; PD; PERFORMANCE; ABSORPTION; ENERGY;
D O I
10.1016/j.mssp.2020.105274
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents, Palladium-based Trench Gate MOSFET (TG-MOSFET) for the detection of hydrogen gas. The sensing mechanism occurs with the dissociation of hydrogen molecules into hydrogen atom and then diffuses into the palladium gate. Thereafter, owing to the polarization of the hydrogen atom, the dipole layer is formed at the palladium-oxide (SiO2) interface. From the perspective of a highly sensitive gas sensor, it is observed that the proposed device has very high sensitivity (10(5) A/A) for different gas pressure applying onto the device. Further, the gate bias dependent sensitivity of the device has been analyzed in terms of change in threshold voltage (Delta Vth), surface potential, energy band, and transconductance for the entire range of gas pressure. Furthermore, the device stability is presented and the impact of temperature has also been investigated on the sensing performance of the device. Result reveals that the proposed device is highly sensitive for the detection of hydrogen gas.
引用
收藏
页数:7
相关论文
共 50 条
  • [31] Chemosorption hydrogen gas sensor based on MOSFET with optical activation
    Stoyanova, T. V.
    Tomaev, V. V.
    Stoyanov, N. D.
    Andreev, S. K.
    18TH INTERNATIONAL SCHOOL ON CONDENSED MATTER PHYSICS: CHALLENGES OF NANOSCALE SCIENCE: THEORY, MATERIALS, APPLICATIONS, 2014, 558
  • [32] Highly sensitive palladium oxide thin film extended gate FETs as pH sensor
    Das, Atanu
    Ko, Danny Hsu
    Chen, Chia-Hsin
    Chang, Liann-Be
    Lai, Chao-Sung
    Chu, Fu-Chuan
    Chow, Lee
    Lin, Ray-Ming
    SENSORS AND ACTUATORS B-CHEMICAL, 2014, 205 : 199 - 205
  • [33] A Highly Sensitive Catalytic Gas Sensor for Hydrogen Detection Based on Sputtered Nanoporous Platinum
    Sturm, H.
    Brauns, E.
    Seemann, T.
    Zoellmer, V.
    Lang, W.
    EUROSENSORS XXIV CONFERENCE, 2010, 5 : 123 - 126
  • [34] Highly sensitive optical sensor for hydrogen gas based on a polymer microcylinder ring resonator
    Bavili, Nima
    Balkan, Timucin
    Morova, Berna
    Eryurek, Mustafa
    Uysalli, Yigit
    Kaya, Sarp
    Kiraz, Alper
    SENSORS AND ACTUATORS B-CHEMICAL, 2020, 310
  • [35] Design and Fabrication Challenges of a Highly Sensitive Thermoelectric-Based Hydrogen Gas Sensor
    Pranti, Anmona Shabnam
    Loof, Daniel
    Kunz, Sebastian
    Zielasek, Volkmar
    Baeumer, Marcus
    Lang, Walter
    MICROMACHINES, 2019, 10 (10)
  • [36] LLC Resonant Converter Based on Trench Gate SiC MOSFET
    Zhou, Yuming
    Chu, Jinkun
    Zhou, Jiahui
    2021 IEEE WORKSHOP ON WIDE BANDGAP POWER DEVICES AND APPLICATIONS IN ASIA (WIPDA ASIA 2021), 2021, : 202 - 205
  • [37] A Highly Sensitive Non-Enzymatic Hydrogen Peroxide Sensor based on Palladium-Gold Nanoparticles
    Banerjee, Saikat
    Hossain, Md Faruk
    Slaughter, Gymama
    2020 IEEE 15TH INTERNATIONAL CONFERENCE ON NANO/MICRO ENGINEERED AND MOLECULAR SYSTEM (IEEE NEMS 2020), 2020, : 286 - 289
  • [38] Continuous palladium-based thin films for hydrogen detection
    Corso, Alain J.
    Angiola, Marco
    Tessarolo, Enrico
    Guidolin, Martino
    Donazzan, Alberto
    Martucci, Alessandro
    Pelizzo, Maria G.
    OPTICAL SENSORS 2017, 2017, 10231
  • [39] A New Gas Sensor Based on MOSFET Having a Horizontal Floating-Gate
    Kim, Chang-Hee
    Cho, In-Tak
    Shin, Jong-Min
    Choi, Kyu-Bong
    Lee, Jung-Kyu
    Lee, Jong-Ho
    IEEE ELECTRON DEVICE LETTERS, 2014, 35 (02) : 265 - 267
  • [40] Mechanism and control technology of trench corner rounding by hydrogen annealing for highly reliable trench MOSFET
    Shimizu, Ryosuke
    Kuribayashi, Hitoshi
    Hiruta, Reiko
    Sudoh, Koichi
    Iwasaki, Hiroshi
    PROCEEDINGS OF THE 18TH INTERNATIONAL SYMPOSIUM ON POWER SEMICONDUCTOR DEVICES & ICS, 2006, : 113 - +