Improvement of Coherence Length in a 200 kHz Swept Light Source with a KTa1-xNbxO3 Deflector Using an Etalon

被引：3

作者：

Ueno, Masahiro ^{[1
]}

Okabe, Yuichi ^{[1
]}

Toyoda, Seiji ^{[1
]}

Sakamoto, Takashi ^{[1
]}

Sasaki, Yuzo ^{[1
]}

Kobayashi, Junya ^{[1
]}

Naganuma, Kazunori ^{[2
]}

Yagi, Shogo ^{[2
]}

机构：

[1] NTT Corp, NTT Photon Labs, Atsugi, Kanagawa 2430198, Japan

[2] NTT Adv Technol Corp, KTN Business Div, Atsugi, Kanagawa 2430198, Japan

来源：

APPLIED PHYSICS EXPRESS | 2013年 / 6卷 / 12期

关键词：

TOMOGRAPHY; OCT;

D O I：

10.7567/APEX.6.122501

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

For swept-source optical tomography, we demonstrate that the coherence length of a light source comprising a Littman-Metcalf external cavity with a KTa1-xNbxO3 (KTN) electrooptic deflector is increased by inserting an etalon into the cavity. Experimental results confirm that inserting the etalon into the laser cavity can significantly improve the coherence length of the laser output from 3.5 to around 23 mm at a 200 kHz repetition rate and 20 mW average output power in a 100 nm scanning range centered at 1.31 mu m. (C) 2013 The Japan Society of Applied Physics

引用

页数：4

共 24 条

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