Moire patterns in van der Waals heterostructures

被引:24
|
作者
Le Ster, Maxime [1 ]
Maerk, Tobias [1 ]
Kowalczyk, Pawel J. [2 ]
Brown, Simon A. [1 ]
机构
[1] Univ Canterbury, Dept Phys & Astron, MacDiarmid Inst Adv Mat & Nanotechnol, Private Bag 4800, Christchurch 8140, New Zealand
[2] Univ Lodz, Fac Phys & Appl Informat, Dept Solid State Phys, Pomorska 149-153, PL-90236 Lodz, Poland
关键词
SCANNING-TUNNELING-MICROSCOPY; DIRAC FERMIONS; GRAPHENE; ANTIMONENE; BISMUTH; BI; SUBSTRATE; IMAGES; FILMS; SIZE;
D O I
10.1103/PhysRevB.99.075422
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Using scanning tunneling microscopy, we report the observation of moire patterns (MPs) on van der Waals heterostructures comprised of various 2D allotropes of bismuth and antimony grown on highly ordered pyrolytic graphite and MoS2. The spatial periods of the MPs range from lambda similar to 1 to similar to 10 nm. For all the reported cases (alpha-bismuthene, alpha-antimonene, beta-antimonene, and monolayer bismuthene), we model the observations using a simple superposition model (SSM). Where possible, the results obtained from the SSM are compared to analytical prediction. MPs emerging from mixed symmetry stacking (hexagonal on rectangular) are explained without requiring commensuration of the layers.
引用
收藏
页数:10
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