Single-laser polarization-controlled optical sampling system for THz-TDS

被引：19
|
作者：
Kolano, Michael [1 ,2 ,3 ]
Graef, Benedict [1 ,2 ,3 ]
Weber, Stefan [1 ,2 ,3 ]
Molter, Daniel [3 ]
von Freymann, Georg [1 ,2 ,3 ]
机构：
[1] Univ Kaiserslautern, Dept Phys, D-67663 Kaiserslautern, Germany
[2] Univ Kaiserslautern, Res Ctr OPTIMAS, D-67663 Kaiserslautern, Germany
[3] Fraunhofer Inst Ind Math ITWM, Ctr Mat Characterizat & Testing, D-67663 Kaiserslautern, Germany
来源：
OPTICS LETTERS | 2018年 / 43卷 / 06期
关键词：
TIME-DOMAIN SPECTROSCOPY; TERAHERTZ; MODE; GENERATION; PULSES;
D O I：
10.1364/OL.43.001351
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
We demonstrate a polarization-multiplexed,single-laser system for terahertz (THz) time-domain spectroscopy without an external delay line. The fiber laser emits two pulse trains with independently adjustable repetition rates, utilizing only one laser-active section and one pump diode. With a standard fiber-coupled THz setup and a polarization-multiplexed optical amplifier, we are able to measure transients with a spectral bandwidth of 1.5 THz and a dynamic range of 50 dB in a measurement time of 1 s. Based on the novel laser architecture, we call this new approach single-laser polarization- controlled optical sampling, or SLAPCOPS. (C) 2018 Optical Society of America
引用
收藏
页码：1351 / 1354
页数：4
相关论文
共 50 条
  • [31] Efficient Method for Estimating Random Errors in Optical Constants Measured with THz-TDS
    Hiromoto, Norihisa
    Tripathi, Saroj R.
    Aoki, Makoto
    Mochizuki, Kento
    Toshiaki, Asahi
    Hosako, Iwao
    2010 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO) AND QUANTUM ELECTRONICS AND LASER SCIENCE CONFERENCE (QELS), 2010,
  • [32] Banknotes Anti-counterfeiting System Based on THz-TDS Confocal Imaging
    Ma Yong
    Liu Yi
    He Jincheng
    Yang Longliang
    Yang Lihao
    Pan Wu
    Zhang Zhen
    Yang Huan
    Zhou Xingye
    Liang Shixiong
    Feng Zhihong
    Liu Jiacheng
    Han Yuhang
    Xu Qianwen
    AOPC 2021: INFRARED DEVICE AND INFRARED TECHNOLOGY, 2021, 12061
  • [33] Thickness Measurement Method of the Paint Coating Layer Using THz-TDS System
    Jang, Hye-Lim
    Han, Dae-Hyun
    Kang, Lae-Hyong
    JOURNAL OF THE KOREAN SOCIETY FOR NONDESTRUCTIVE TESTING, 2020, 40 (04) : 259 - 265
  • [34] Molecular detection of sodium nitrate and sodium nitrite based on THz-TDS system
    Wang, Jiahui
    Su, Bo
    Wen, Yiwei
    Wu, Yaxiong
    He, Jingsuo
    Zhang, Cunlin
    INFRARED, MILLIMETER-WAVE, AND TERAHERTZ TECHNOLOGIES VI, 2019, 11196
  • [35] Very compact THz-TDS imaging system with diffraction limited spatial resolution
    Watanabe, Shinichi
    Shimano, Ryo
    2007 JOINT 32ND INTERNATIONAL CONFERENCE ON INFRARED AND MILLIMETER WAVES AND 15TH INTERNATIONAL CONFERENCE ON TERAHERTZ ELECTRONICS, VOLS 1 AND 2, 2007, : 56 - 57
  • [36] THz wave polarization-controlled spectroscopic imaging for anisotropic materials
    Zhang, LiangLiang
    Zhong, Hua
    Deng, Chao
    Zhang, CunLin
    Zhao, YueJin
    OPTICS COMMUNICATIONS, 2011, 284 (19) : 4356 - 4359
  • [37] Comparison of random errors with dynamic range in the optical parameters of ZnTe measured by THz-TDS
    Tripathi, Saroj R.
    Aoki, Makoto
    Mochizuki, Kento
    Hosako, Iwao
    Asahi, Toshiaki
    Hiromoto, Norihisa
    2009 34TH INTERNATIONAL CONFERENCE ON INFRARED, MILLIMETER, AND TERAHERTZ WAVES, VOLS 1 AND 2, 2009, : 707 - +
  • [38] Analysis of High Voltage Dielectric Insulation Materials of XLPE by THz-TDS System
    Shi, Wei
    Yan, Zhijin
    Yang, Lei
    Dai, Yang
    Zhang, Like
    Bian, Kangkang
    Hou, Lei
    SELECTED PAPERS OF THE PHOTOELECTRONIC TECHNOLOGY COMMITTEE CONFERENCES, 2015, 9795
  • [39] Optical metasurfaces for polarization-controlled beam shaping
    Avayu, Ori
    Eisenbach, Omri
    Ditcovski, Ran
    Ellenbogen, Tal
    OPTICS LETTERS, 2014, 39 (13) : 3892 - 3895
  • [40] Polarization-controlled single-mode VCSEL
    Yoshikawa, T
    Kawakami, T
    Saito, H
    Kosaka, H
    Kajita, M
    Kurihara, K
    Sugimoto, Y
    Kasahara, K
    IEEE JOURNAL OF QUANTUM ELECTRONICS, 1998, 34 (06) : 1009 - 1015
12345