Infrared Protection System for High-Voltage Testing of SiC and GaN FETs used in DC-DC Converters

被引:0
|
作者
Hormot, Filip [1 ]
Bacmaga, Josip [1 ]
Baric, Adrijan [1 ]
机构
[1] Univ Zagreb, Fac Elect Engn & Comp, Unska 3, Zagreb 10000, Croatia
关键词
hazardous DC voltage; high-voltage switch-mode power converter;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This technical paper presents the design and testing of the protection system for evaluation of high-voltage devices and circuits, e.g. SiC and GaN devices or high-voltage switching DC-DC converters. The high-voltage testing area is protected from invading by an array of infrared (IR) emitters and detectors. Whenever an object passes through the IR protected space, a high-voltage DC source is disconnected from its power supply and harmful effects of high DC voltage are avoided. The functionality of the developed system is tested and its characteristic response timings are measured.
引用
收藏
页码:72 / 75
页数:4
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