METHODOLOGY AND THE COMPUTER CODE "BEAM SCANNING" FOR CALCULATION OF PROCESSES IN SCANNING SYSTEM OF THE RELATIVISTIC ELECTRON BEAM WITH THE WIDE ENERGY SPECTRUM

被引：0
|
作者：
Bystrov, P. A. [1 ]
Rozanov, N. E. [1 ]
机构：
[1] Russian Acad Sci, Moscow Radiotech Inst, Moscow 117901, Russia
来源：
PROBLEMS OF ATOMIC SCIENCE AND TECHNOLOGY | 2012年 / 04期
关键词：
D O I：
暂无
中图分类号：
O57 [原子核物理学、高能物理学];
学科分类号：
070202 ;
摘要：
Methodology of calculation of processes in scanning system of sterilizing installation based on linear standingwave RF accelerator is described. Computer code "BEAM SCANNING" based on this methodology is created. Results of preliminary calculations with the use of this code are presented. Some important effects accompanied the work of scanning system of sterilizing installation and caused by the wide energy spectrum of electron beam, by beam scattering in a titanic foil of an output window of scanning system and by the large angle of a deviation of the beam at the scanning processes are demonstrated.
引用
收藏
页码：87 / 91
页数：5
相关论文
共 50 条
  • [21] RANGE ENERGY RELATIONSHIP FOR A SCANNING BEAM ELECTRON LINEAR-ACCELERATOR
    ANDERSON, DW
    GEORGE, FS
    PHYSICS IN MEDICINE AND BIOLOGY, 1985, 30 (05): : 461 - 465
  • [22] RANGE ENERGY RELATIONSHIP FOR A SCANNING BEAM ELECTRON LINEAR-ACCELERATOR
    MARKUS, B
    PHYSICS IN MEDICINE AND BIOLOGY, 1986, 31 (06): : 657 - 661
  • [23] The Influence of the Peak Energy of Scanning Electron Beam on the Surface Temperature Field
    Li X.-K.
    Wang R.
    Hu L.-Y.
    Ren X.-L.
    Wang X.-S.
    Surface Technology, 2022, 51 (07): : 306 - 313
  • [24] An electron beam lithography and digital image acquisition system for scanning electron microscopes
    Russev, S.
    Tsutsumanova, G.
    Angelov, S.
    Bachev, K.
    JOURNAL OF MICROSCOPY, 2007, 226 (01) : 64 - 70
  • [25] LARGE FIELD DEFLECTION SYSTEM FOR SCANNING ELECTRON-BEAM TECHNOLOGY
    OWEN, G
    NIXON, WC
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1974, 121 (03) : C109 - C109
  • [26] Development of scanning probe parallel nanowriting system with electron beam resist
    Matsuzuka, Naoki
    Tanaka, Bungo
    Nagarmira, Toshihiko
    Sasaki, Tobru
    Namaza, Takahiro
    Isono, Yoshitada
    TRANSDUCERS '07 & EUROSENSORS XXI, DIGEST OF TECHNICAL PAPERS, VOLS 1 AND 2, 2007,
  • [27] DYNAMIC ABERRATION CORRECTION IN A COMBINED SCANNING ELECTRON BEAM SYSTEM.
    XIMEN JI-YE
    LI YU
    1982, V 62 (N 3): : 287 - 297
  • [28] DYNAMIC ABERRATION CORRECTION IN A COMBINED SCANNING ELECTRON-BEAM SYSTEM
    XIMEN, JY
    LI, Y
    OPTIK, 1982, 62 (03): : 287 - 297
  • [29] A PC-CONTROLLED BEAM SCANNING SYSTEM AT THE TECHNOLOGICAL ELECTRON LINAC
    Karasyov, S. P.
    Pomatsalyuk, R. I.
    Tenishev, A. Eh.
    Uvarov, V. L.
    Shevchenko, V. A.
    Shlyakhov, I. N.
    PROBLEMS OF ATOMIC SCIENCE AND TECHNOLOGY, 2006, (03): : 191 - 193
  • [30] QUALITY ASSURANCE OF ELECTRON-BEAM ENERGY BY COMPUTER-CONTROLLED SCANNING OF FILM EXPOSED BENEATH A WEDGE
    MOYER, RF
    HAUSER, JF
    MEDICAL PHYSICS, 1983, 10 (04) : 519 - 519
12345