A Hardware-In-The-Loop Test System for Electronic Control Unit of Dual-Clutch Transmission Vehicle

被引：6
|
作者：
Chen, Ran [1 ]
Mi, Lin [1 ]
Tan, Wei [1 ]
机构：
[1] Chongqing Univ Techonl, Minist Educ, Key Lab Manufacture & Test Tech Automobile Parts, Chongqing 400050, Peoples R China
来源：
MECHATRONICS AND INTELLIGENT MATERIALS II, PTS 1-6 | 2012年 / 490-495卷
关键词：
hardware-in-the-loop simulation(HILS); test system; electronic control unit (ECU); dual-clutch transmission (DCT); vehicle; patent;
D O I：
10.4028/www.scientific.net/AMR.490-495.13
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
Hardware-in-the-loop simulation (HILS) is a scheme that incorporates some hardware components of primary concern in the numerical simulation environment. This paper discusses the implementation and benefits of using the HIL testing system for electronic control unit of dual-clutch transmission (DCT) vehicle.
引用
收藏
页码：13 / 18
页数：6
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