Efficiency droop in blue InGaN/GaN single-quantum-well light-emitting diodes on the Si substrate

被引:6
|
作者
Liu, M. L. [1 ,2 ]
Ye, Z. Q. [2 ]
Lei, M. S. [2 ]
机构
[1] Nanchang Univ, Sch Mat Sci & Engn, Nanchang 330047, Peoples R China
[2] Jiangxi Normal Univ, Coll Phys & Commun Elect, Nanchang 330022, Peoples R China
基金
中国国家自然科学基金;
关键词
D O I
10.1088/0268-1242/27/4/045010
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
With the simple ABC model, we demonstrated that the internal quantum efficiency (IQE) of InGaN light-emitting diodes (LEDs) at lower temperature must be higher than that at higher temperature without carrier leakage; this is contradicted by the experimental results of blue InGaN/GaN single-quantum-well (SQW) LEDs. Combined with the variations of IQE and dominant wavelength of SQW LEDs with forward current density, we believe that the electrons will overflow from the well easily after filling up in a higher state, and electron leakage is the main factor for efficiency droop.
引用
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页数:4
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