Characterization of Miniature Near Field Probes for IC's Radiation Measurements

被引：0
|
作者：
Avram, Cristian [1 ]
Gavrila, Gheorghe [1 ]
Tao, Junwu [2 ]
机构：
[1] Mil Tech Acad, Bucharest, Romania
[2] Natl Polytech Inst, Toulouse, France
来源：
PROCEEDINGS OF THE 2010 8TH INTERNATIONAL CONFERENCE ON COMMUNICATIONS (COMM) | 2010年
关键词：
near field scan; IC emission measurement; probe calibration; electromagnetic radiation;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
In this paper, the near-field scan bench developed at Electronics Laboratory at ENSEEIHT is presented. A simple methodology for calibrating the miniature probes is described, which allows to determine the electromagnetic radiation levels from an IC without needing fastidious post-processing calculations. Then, the near-field emissions from a imager integrated circuit are measured and analyzed. Scan results give accurate information about current flows and voltage drops and parasite coupling inside the component.
引用
收藏
页码：275 / 278
页数：4
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