Guest Editors' Introduction: Yield Learning Processes and Methods

被引：0
|
作者：
Gattiker, Anne [1 ]
Nigh, Phil [2 ]
机构：
[1] IBM Corp, Armonk, NY 10504 USA
[2] IBM Server & Technol Grp, Microelect Div, Armonk, NY USA
来源：
IEEE DESIGN & TEST OF COMPUTERS | 2012年 / 29卷 / 01期
关键词：
D O I：
10.1109/MDT.2011.2180958
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：6 / 7
页数：2
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