Guest Editors' Introduction: Yield Learning Processes and Methods

被引：0

|

作者：

Gattiker, Anne ^{[1
]}

Nigh, Phil ^{[2
]}

机构：

[1] IBM Corp, Armonk, NY 10504 USA

[2] IBM Server & Technol Grp, Microelect Div, Armonk, NY USA

来源：

IEEE DESIGN & TEST OF COMPUTERS | 2012年 / 29卷 / 01期

关键词：

D O I：

10.1109/MDT.2011.2180958

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

收藏

页码：6 / 7

页数：2

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