Lipid mixing exposed in pulmonary surfactant films using time of flight - Secondary ion mass spectrometry (TOF-SIMS)

被引:0
|
作者
Harbottle, RR [1 ]
Nag, K [1 ]
McIntyre, NS [1 ]
Possmayer, F [1 ]
Petersen, NO [1 ]
机构
[1] Univ Western Ontario, London, ON N6A 5B7, Canada
关键词
D O I
暂无
中图分类号
Q6 [生物物理学];
学科分类号
071011 ;
摘要
2552
引用
收藏
页码:522A / 522A
页数:1
相关论文
共 50 条
  • [41] Imaging and quantitative analysis of insecticide in mosquito net fibers using Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)
    Smith, Stephen C.
    Zhou, Chuanzhen
    Stevie, Fred A.
    Garcia, Roberto
    PLOS ONE, 2018, 13 (12):
  • [42] Biomarker imaging of single diatom cells in a microbial mat using time-of-flight secondary ion mass spectrometry (ToF-SIMS)
    Leefmann, Tim
    Heim, Christine
    Kryvenda, Anastasiia
    Siljestrom, Sandra
    Sjovall, Peter
    Thiel, Volker
    ORGANIC GEOCHEMISTRY, 2013, 57 : 23 - 33
  • [43] Stereoregular polypropylenes studied by time-of-flight secondary ion mass spectrometry (ToF-SIMS) and atomic force microscopy (AFM)
    Xu, KY
    Gusev, AI
    Hercules, DM
    SURFACE AND INTERFACE ANALYSIS, 1999, 27 (07) : 659 - 669
  • [44] Quantitative accuracy assessment of trace elements and halogens in apatite by time-of-flight secondary ion mass spectrometry (TOF-SIMS)
    Wang, Meng-Qin
    Cai, Ke-Da
    Li, Zhan-Ping
    Guo, Chong
    JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY, 2024, 39 (06) : 1609 - 1615
  • [45] DETECTION OF COLLECTORS ON CONCENTRATOR MINERAL GRAINS BY TIME-OF-FLIGHT SECONDARY-ION MASS-SPECTROMETRY (TOF-SIMS)
    CHRYSSOULIS, SL
    STOWE, KG
    NIEHUIS, E
    CRAMER, HG
    BENDEL, C
    KIM, JY
    TRANSACTIONS OF THE INSTITUTION OF MINING AND METALLURGY SECTION C-MINERAL PROCESSING AND EXTRACTIVE METALLURGY, 1995, 104 : C141 - C150
  • [46] Surface analysis of softened paper by time-of-flight secondary ion mass spectrometry (ToF-SIMS) and the Kawabata evaluation system
    M. Parfitt
    J. C. Vickerman
    R. Mitchell
    C. M. Carr
    N. Ince
    P. Knight
    Journal of Materials Science, 2003, 38 : 2171 - 2177
  • [47] Surface analysis of softened paper by time-of-flight secondary ion mass spectrometry (ToF-SIMS) and the Kawabata evaluation system
    Parfitt, M
    Vickerman, JC
    Mitchell, R
    Carr, CM
    Ince, N
    Knight, P
    JOURNAL OF MATERIALS SCIENCE, 2003, 38 (10) : 2171 - 2177
  • [48] Characterization of heterocyclic new compounds' structure using time-of-flight secondary ion mass spectrometry(TOF-SIMS) combined with chemical derivation
    Deng, ZH
    Zong, XF
    Ren, PD
    Dong, TW
    ACTA CHIMICA SINICA, 1996, 54 (08) : 802 - 806
  • [49] Imaging of vitamin D in psoriatic skin using time-of-flight secondary ion mass spectrometry (ToF-SIMS): A pilot case study
    Vandikas, Maria Siekkeri
    Hellstrom, Evelina
    Malmberg, Per
    Osmancevic, Amra
    JOURNAL OF STEROID BIOCHEMISTRY AND MOLECULAR BIOLOGY, 2019, 189 : 154 - 160
  • [50] Penetration of corrosive species into copper exposed to simulated O2-free groundwater by time-of-flight secondary ion mass spectrometry (ToF-SIMS)
    Yue, Xiaoqi
    Malmberg, Per
    Isotahdon, Elisa
    Ratia-Hanby, Vilma
    Huttunen-Saarivirta, Elina
    Leygraf, Christofer
    Pan, Jinshan
    CORROSION SCIENCE, 2023, 210