Sub-micrometer pattern generation by diffractive mask-aligner lithography

被引:2
|
作者
Zeitner, Uwe D. [1 ,2 ]
Stuerzebecher, Lorenz [1 ]
Harzendorf, Torsten [2 ]
Fuchs, Frank [2 ]
Michaelis, Dirk [2 ]
机构
[1] Univ Jena, Inst Appl Phys, Abbe Ctr Photon, A Einstein Str 15, D-07743 Jena, Germany
[2] Univ Jena, Fraunhofer Inst Appl Opt & Precis Engn, D-07745 Jena, Germany
关键词
microstructure fabrication; lithography; diffraction; micro-optics;
D O I
10.1117/12.909806
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A novel technique for the fabrication of high resolution sub-micrometer patterns by diffractive proximity lithography in a mask-aligner is presented. The technique is based on the use of specially designed diffractive photo-masks. It requires some small modifications of the mask-aligner, especially for the mask illumination and the settings of the proximity gap between mask and substrate. The huge potential of this novel technique is demonstrated at the example of structures having lateral feature sizes in the sub-500nm range printed with mask-to-substrate distances of several ten micrometers.
引用
收藏
页数:7
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