Process Yield for a Manufactured Product

To evaluate the process yield for a manufactured product with multiple characteristics is an important task in the manufacturing industry We present a general procedure based on the statistical distance metric and the geometric distance metric to evaluate the process yield for a manufactured product with multivariate normal/non-normal data. We select the normal distribution and the three-parameter Burr XII distribution to fit the statistical distance data and the geometric distance data, respectively. The process yield indices provide an exact measure of the overall process yield. This study uses three real examples to demonstrate the performance of the proposed approach. The results show that our procedure is an effective approach of evaluating the process yield for a manufactured product with multiple characteristics.