Nanoscale Electrowetting Effects Studied by Atomic Force Microscopy

被引：10
|
作者：
Guan, Li [1 ]
Qi, Guicun [1 ]
Liu, Sheng [1 ]
Zhang, Hui [1 ]
Zhang, Zhong [1 ]
Yang, Yanlian [1 ]
Wang, Chen [1 ]
机构：
[1] Natl Ctr Nanosci & Technol, Beijing 100190, Peoples R China
来源：
JOURNAL OF PHYSICAL CHEMISTRY C | 2009年 / 113卷 / 02期
基金：
中国国家自然科学基金;
关键词：
CONTACT-ANGLE SATURATION; SURFACE-TENSION; WATER; ELECTRODES; CHARGE; FIELDS; MODEL;
D O I：
10.1021/jp806538r
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
Electric field effect on adhesive characteristics of the polymethyl methacrylate (PMMA) surface is studied by using force spectroscopy method of atomic force microscope (AFM). The adhesive interaction between the AFM tip and dielectric surface is obtained by monitoring the force-distance spectroscopy, which reflects the change of the surface tension under the influence of external electric field. Such changes in adhesion characteristics are attributed to the electrowetting effect at relatively low electrical field strength and the electrowetting saturation effect at high electrical field strength. It is also suggested that the force spectroscopy method has noticeably high stability in studying adhesion characteristics at nanometer scale.
引用
收藏
页码：661 / 665
页数：5
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