Influence Of Si Layer Thickness On The Structure And Magnetic Properties Of Si/Fe Multilayers

A series of Si/Fe multilayers were prepared by dc-magnetron sputtering at ambient temperature. Structural and magnetic properties were investigated as a function of Si layer thickness. X-ray diffraction and high resolution transmission electron diffraction data show that the Fe layers are nanocrystalline whereas the Si layers are amorphous. The position of the Fe (110) peak was found to be shifted towards the higher 2 theta side of the bulk value due to intrinsic compressive stress on the Fe layers induced by adjacent Si layers. The in-plane magnetization measurements show soft ferromagnetic behavior with strong in-plane magnetic anisotropy. Saturation magnetization remains almost constant for t(Si) >= 30 angstrom and shows a slight increase towards bulk value of Fe for t(Fe) < 30 angstrom.