Development of fluorescence-yield wavelength-dispersive x-ray absorption spectroscopy in the soft x-ray region for time-resolved experiments

被引:12
|
作者
Amemiya, K. [1 ,2 ]
Sakata, K. [1 ]
Suzuki-Sakamaki, M. [1 ,3 ]
机构
[1] High Energy Accelerator Res Org, Inst Mat Struct Sci, 1-1 Oho, Tsukuba, Ibaraki 3050801, Japan
[2] SOKENDAI Grad Univ Adv Studies, Dept Mat Struct Sci, 1-1 Oho, Tsukuba, Ibaraki 3050801, Japan
[3] Gunma Univ, Grad Sch Sci & Technol, 1-5-1 Tenjin Cho, Kiryu, Gunma 3768515, Japan
来源
REVIEW OF SCIENTIFIC INSTRUMENTS | 2020年 / 91卷 / 09期
关键词
SPECTROMETER;
D O I
10.1063/5.0021981
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A fluorescence-yield wavelength-dispersive x-ray absorption spectroscopy technique in the soft x-ray region, by which the x-ray absorption spectra are recorded without scanning the monochromator, has been developed. The wavelength-dispersed soft x rays, in which the wavelength (photon energy) continuously changes as a function of the position, illuminate the sample, and the emitted fluorescence soft x rays at each position are separately focused by an imaging optics onto each position at a soft x-ray detector. Ni L-edge x-ray absorption spectra for Ni and NiO thin films taken in the wavelength-dispersive mode are shown in order to demonstrate the validity of the technique. The development of the technique paves the way for a real-time observation of time-dependent processes, such as surface chemical reactions, with much higher gas pressure compared to the electron-yield mode, as well as under magnetic and electric fields.
引用
收藏
页数:5
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