Particle-in-cell simulation of the focusing properties of high energy electron beam in plasma ion channel

被引：1
|
作者：
Meng, L [1 ]
Xie, WK [1 ]
Liu, SG [1 ]
机构：
[1] Univ Elect Sci & Technol China, High Energy Elect Inst, Chengdu 610054, Sichuan, Peoples R China
来源：
INTERNATIONAL JOURNAL OF INFRARED AND MILLIMETER WAVES | 1999年 / 20卷 / 08期
关键词：
electron beam; plasma; ion channel; particle-in-cell simulation; discharge;
D O I：
10.1023/A:1021756603342
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The focusing properties of high energy electron beam in ion channel is investigated in the paper. The collisions of electrons with the neutral gas and the ionization resulted are considered to study the formation of ion channels with PIC method. The effects of various parameters on the beam focusing are analyzed.
引用
收藏
页码：1493 / 1499
页数：7
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