Determination of mercury by total-reflection X-ray fluorescence using amalgamation with gold

被引:100
|
作者
Bennun, L [1 ]
Gomez, J [1 ]
机构
[1] UNIV SIMON BOLIVAR,CARACAS 1080A,VENEZUELA
关键词
environmental pollution by mercury; mercury amalgamation with gold; mercury determination; total-reflection X-ray fluorescence (TXRF);
D O I
10.1016/S0584-8547(97)00003-7
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
摘要
Analysis by total-reflection X-ray fluorescence (TXRF) is unsuitable for determining mercury concentrations because the usual sample preparation produces evaporation and loss of this element as a consequence of its high vapour pressure and low boiling point. A method that has been developed to achieve this determination involves forming an amalgam while a thin layer of silver (obtained by sputtering or evaporation) is in contact with an ionic solution of Hg; subsequently, a traditional TXRF analysis is performed. This was the first method reported in the literature to apply the TXRF technique for reliably determining mercury concentrations with high sensitivity. This work shows how a similar procedure may be employed to measure mercury concentrations. This second method involves forming an amalgam of gold using microlitre quantities of the solution to be analysed. As gold is a highly malleable material, it allows the production of very thin films, the weight of which is a few orders of magnitude higher than the mass of mercury present in the amalgam. The determination is performed in the usual way using the TXRF technique. The sensitivity of this method (approximate to 5 ppm) is inferior to that of the former method, and data processing is quite difficult because the peaks for mercury and gold overlap, but the experiment is simple to execute and improved sensitivity is expected to be attained by forming the amalgam with larger volumes of sample and with a more responsive data processing scheme. (C) 1997 Elsevier Science B.V.
引用
收藏
页码:1195 / 1200
页数:6
相关论文
共 50 条
  • [21] Calibration of total-reflection X-ray fluorescence using a nickel bulk sample
    Knoth, J
    Beaven, P
    Schwenke, H
    Dobler, M
    Reus, U
    SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 2001, 56 (11) : 2275 - 2281
  • [22] Optimisation of total-reflection X-ray fluorescence for aerosol analysis
    Injuk, J
    VanGrieken, R
    SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1995, 50 (14) : 1787 - 1803
  • [23] Trace element determination in diesel particulates by total-reflection X-ray fluorescence analysis
    Vilhunen, JK
    von Bohlen, A
    Schmeling, M
    Rantanen, L
    Mikkonen, S
    Klockenkämper, R
    Klockow, D
    MIKROCHIMICA ACTA, 1999, 131 (3-4) : 219 - 223
  • [24] Determination of trace elements in macrozoobenthos samples by total-reflection X-ray fluorescence analysis
    Miesbauer, H
    Köck, G
    Füreder, L
    SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 2001, 56 (11) : 2203 - 2207
  • [25] Determination of phosphorus and other elements in atmospheric aerosols using synchrotron total-reflection X-ray fluorescence
    Fittschen, Ursula E. A.
    Streli, Christina
    Meirer, Florian
    Alfeld, Matthias
    X-RAY SPECTROMETRY, 2013, 42 (05) : 368 - 373
  • [26] Determination of metals and their species in aquatic humic substances by using total-reflection X-ray fluorescence spectrometry
    Inst for Spectrochemistry and, Applied Spectroscopy, Dortmund, Germany
    Spectrochim Acta Part B At Spectrosc, 7 (1009-1018):
  • [27] Determination of metals and their species in aquatic humic substances by using total-reflection X-ray fluorescence spectrometry
    Aster, B
    vonBohlen, A
    Burba, P
    SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1997, 52 (07) : 1009 - 1018
  • [28] Sapphire sample carriers for silicon determination by total-reflection X-ray fluorescence analysis
    Theisen, M
    Niessner, R
    SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1999, 54 (13) : 1839 - 1848
  • [29] Trace Element Determination in Diesel Particulates by Total-Reflection X-Ray Fluorescence Analysis
    Juha K. Vilhunen
    Alex von Bohlen
    Martina Schmeling
    Leena Rantanen
    Seppo Mikkonen
    Reinhold Klockenkämper
    Dieter Klockow
    Microchimica Acta, 1999, 131 : 219 - 223
  • [30] Total-reflection x-ray microscopy
    Jibaoui, H
    Erre, D
    Cazaux, J
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2001, 72 (07): : 2966 - 2970