HTS scanning SQUID microscopy of active circuits

被引:36
|
作者
Fleet, EF [1 ]
Chatraphorn, S
Wellstood, FC
Knauss, LA
机构
[1] Univ Maryland, Ctr Superconduct Res, College Pk, MD 20742 USA
[2] Neocera Inc, Beltsville, MD 20705 USA
关键词
D O I
10.1109/77.783928
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We have used a high-T(c) scanning SQUID microscope to image semiconductor circuits operating in air at room temperature. Our microscope uses a commercially available 77 K refrigerator to cool a YBa(2)Cu(3)O(7-delta) de SQUID. The system maintains vacuum isolation of the SQUID even when it is separated from a room-temperature sample by about 30 mu m. When operated in this manner, the SQUID has a magnetic field sensitivity of 20 pT/root Hz above 500 Hz. By inverting the magnetic field images to generate two-dimensional current density distributions, we localize current paths to within +/-36 mu m at SQUID-sample separations of 150 mu m, We present images and discuss the spatial resolution obtained with this technique.
引用
收藏
页码:4103 / 4106
页数:4
相关论文
共 50 条
  • [1] Scanning SQUID microscopy of integrated circuits
    Chatraphorn, S
    Fleet, EF
    Wellstood, FC
    Knauss, LA
    Eiles, TM
    APPLIED PHYSICS LETTERS, 2000, 76 (16) : 2304 - 2306
  • [2] HTS scanning SQUID microscope
    Itozaki, H
    Kondo, T
    Nagaishi, T
    PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS, 2003, 392 : 1392 - 1395
  • [3] Scanning SQUID microscopy
    Ketchen, MB
    SCIENCE, 1996, 272 (5265) : 1087 - 1087
  • [4] Scanning squid microscopy
    Kirtley, JR
    Wikswo, JP
    ANNUAL REVIEW OF MATERIALS SCIENCE, 1999, 29 : 117 - 148
  • [5] The radio-frequency HTS SQUID for magnetic microscopy
    Khvostov, S.S.
    Timofeev, V.P.
    Garbuz, A.S.
    Shnyrkov, V.I.
    Fizika Nizkikh Temperatur (Kharkov), 2003, 29 (02): : 211 - 215
  • [6] A magnetically coupled SQUID for the digital readout of integrated HTS circuits
    Hidaka, M
    Miura, S
    Satoh, T
    Hattori, W
    Tsai, JS
    Tahara, S
    SUPERCONDUCTOR SCIENCE & TECHNOLOGY, 1996, 9 (4A): : A62 - A65
  • [7] Advanced sensors for scanning SQUID microscopy
    Kirtley, J. R.
    Gibson, G. W., Jr.
    Fung, Y. -K. -K.
    Klopfer, B.
    Nowack, K.
    Kratz, P. A.
    Mol, J. -M.
    Arpes, J.
    Forooghi, F.
    Huber, M. E.
    Bluhm, H.
    Moler, K. A.
    2013 IEEE 14TH INTERNATIONAL SUPERCONDUCTIVE ELECTRONICS CONFERENCE (ISEC), 2013,
  • [8] Vector sensor for scanning SQUID microscopy
    Dang, Vu The (vu-dang@pe.osakafu-u.ac.jp), 1600, IOP Publishing Ltd (871):
  • [9] Scanning SQUID microscopy for current imaging
    Knauss, LA
    Cawthorne, AB
    Lettsome, N
    Kelly, S
    Chatraphorn, S
    Fleet, EF
    Wellstood, FC
    Vanderlinde, WE
    MICROELECTRONICS RELIABILITY, 2001, 41 (08) : 1211 - 1229
  • [10] Vector sensor for scanning SQUID microscopy
    Vu The Dang
    Toji, Masaki
    Ho Thanh Huy
    Miyajima, Shigeyuki
    Shishido, Hiroaki
    Hidaka, Mutsuo
    Hayashi, Masahiko
    Ishida, Takekazu
    29TH INTERNATIONAL SYMPOSIUM ON SUPERCONDUCTIVITY, 2017, 871