On mechanical contacts to porous silicon

被引：0
|
作者：
Mares, JJ
Kristofik, J
Hubik, P
机构：
[1] Institute of Physics, Acad. of Sci. of the Czech Republic, Praha 6
来源：
THIN SOLID FILMS | 1997年 / 295卷 / 1-2期
关键词：
contacts; electrical properties and measurements; resistivity; silicon;
D O I：
10.1016/S0040-6090(96)09318-2
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
We have studied the behaviour of mechanical, electrically conductive contacts to porous silicon (PS). It has been found that the electrical properties of such contacts depend sensitively on the particular arrangement and the mechanical forces applied. The characteristic differences between a fat contact and a contact made by pressing a metallic ball against PS, as well as irreversible effects due to the crushing of PS are discussed within the frame of a simple model. (C) 1997 Elsevier Science S.A.
引用
收藏
页码：305 / 309
页数：5
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