Electronic and Structural Properties of Turbostratic Epitaxial Graphene on the 6H-SiC (000-1) Surface

被引:2
|
作者
Jayasekera, Thushari [1 ]
Kim, K. W. [2 ]
Nardelli, M. Buongiorno [3 ,4 ]
机构
[1] So Illinois Univ, Dept Phys, Carbondale, IL 62901 USA
[2] N Carolina State Univ, Dept Elect & Comp Engn, Raleigh, NC 27695 USA
[3] Univ N Texas, Dept Phys, Denton, TX 76203 USA
[4] Oak Ridge Natl Lab, Comp Sci & Math Div, Oak Ridge, TN 37831 USA
来源
SILICON CARBIDE AND RELATED MATERIALS 2011, PTS 1 AND 2 | 2012年 / 717-720卷
关键词
epitaxial graphene; turbostratic; Moire patterns; SiC C-face; GRAPHITE;
D O I
10.4028/www.scientific.net/MSF.717-720.595
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We propose an atomistic model to study the interface properties of mis-oriented (Wrbostratic) epitaxial graphene on the 6H-SiC (000-1) surface. Using calculations from first principles, we compare the energetics and structural/electronic properties of AB and turbostratic stacking sequences within a model based on the Si adatom surface reconstruction. Our calculations show that the systems with AB and turbostratic sequences are very close in energy, demonstrating the possibility of observation of Moire patterns in epitaxial graphene on the C-face of 6H-SiC. The two-dimensional electron gas behavior is preserved in the epitaxial turbostratic graphene systems. However, there are deviations from the ideal turbostratic graphene.
引用
收藏
页码:595 / +
页数:2
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