Toward Quantitative Electrochemical Measurements on the Nanoscale by Scanning Probe Microscopy: Environmental and Current Spreading Effects

被引:17
|
作者
Arruda, Thomas M. [1 ]
Kumar, Amit [1 ]
Jesse, Stephen [1 ]
Veith, Gabriel M. [2 ]
Tselev, Alexander [1 ]
Baddorf, Arthur P. [1 ]
Balke, Nina [1 ]
Kalinin, Sergei V. [1 ]
机构
[1] Oak Ridge Natl Lab, Ctr Nanophase Mat Sci, Oak Ridge, TN 37831 USA
[2] Oak Ridge Natl Lab, Mat Sci & Technol Div, Oak Ridge, TN 37831 USA
关键词
scanning probe microscopy; solid state electrolyte; counter electrode effects; Li ion battery; nanoscale electrochemistry; SILICON SURFACES; FORCE MICROSCOPY; ION; OXIDATION; FILMS;
D O I
10.1021/nn4034772
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
The application of electric bias across tip surface junctions in scanning probe microscopy can readily induce surface and bulk electrochemical processes that can be further detected though changes in surface topography, Faradaic or conductive currents, or electromechanical strain responses. However, the basic factors controlling tip-induced electrochemical processes, including the relationship between applied tip bias and the thermodynamics of local processes, remains largely unexplored. Using the model Li-ion reduction reaction on the surface in Li-ion conducting glass ceramic, we explore the factors controlling Li-metal formation and find surprisingly strong effects of atmosphere and back electrode composition on the process. We find that reaction processes are highly dependent on the nature of the counter electrode and environmental conditions. Using a nondepleting Li counter electrode, Li particles could grow significantly larger and faster than a depleting counter electrode. Significant Li ion depletion leads to the inability for further Li reduction. Time studies suggest that Li diffusion replenishes the vacant sites after similar to 12 h. These studies suggest the feasibility of SPM-based quantitative electrochemical studies under proper environmental controls, extending the concepts of ultramicroelectrodes to the single-digit nanometer scale.
引用
收藏
页码:8175 / 8182
页数:8
相关论文
共 50 条
  • [31] Nanoscale intermittent contact-scanning electrochemical microscopy
    Lazenby, Robert A.
    McKelvey, Kim
    Peruffo, Massimo
    Baghdadi, Marc
    Unwin, Patrick R.
    JOURNAL OF SOLID STATE ELECTROCHEMISTRY, 2013, 17 (12) : 2979 - 2987
  • [32] Nanoscale intermittent contact-scanning electrochemical microscopy
    Robert A. Lazenby
    Kim McKelvey
    Massimo Peruffo
    Marc Baghdadi
    Patrick R. Unwin
    Journal of Solid State Electrochemistry, 2013, 17 : 2979 - 2987
  • [33] SCANNING PROBE MICROSCOPY FOR THERMAL TRANSPORT MEASUREMENTS
    Jeong, Wonho
    Hur, Sunghoon
    Meyhofer, Edgar
    Reddy, Pramod
    NANOSCALE AND MICROSCALE THERMOPHYSICAL ENGINEERING, 2015, 19 (04) : 279 - 302
  • [34] Alternating Current Measurements in Scanning Electrochemical Microscopy, Part 2: Detection of Adsorbates
    Dao Trinh
    Keddam, Michel
    Ramon Novoa, Xose
    Vivier, Vincent
    CHEMPHYSCHEM, 2011, 12 (11) : 2177 - 2183
  • [35] Note: Circuit design for direct current and alternating current electrochemical etching of scanning probe microscopy tips
    Jobbins, Matthew M.
    Raigoza, Annette F.
    Kandel, S. Alex
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2012, 83 (03):
  • [36] Double layer effects in voltammetric measurements with scanning electrochemical microscopy (SECM)
    Tan, Sze-yin
    Perry, David
    Unwin, Patrick R.
    JOURNAL OF ELECTROANALYTICAL CHEMISTRY, 2018, 819 : 240 - 250
  • [37] Nanoscale patterning and deformation of soft matter by scanning probe microscopy
    Kassavetis, S.
    Mitsakakis, K.
    Logothetidis, S.
    MATERIALS SCIENCE & ENGINEERING C-BIOMIMETIC AND SUPRAMOLECULAR SYSTEMS, 2007, 27 (5-8): : 1456 - 1460
  • [38] Nanoscale Mechanical Scratching of Graphene Using Scanning Probe Microscopy
    Suda, Ryutaro
    Saito, Takanari
    Tseng, Ampere A.
    Shirakashi, Jun-ichi
    PROCEEDINGS OF THE 2013 IEEE 5TH INTERNATIONAL NANOELECTRONICS CONFERENCE (INEC), 2013, : 285 - 287
  • [39] Analysis of Probe Current in Scanning Electron Microscopy
    Lim, Sun-Jong
    Lee, Chan-Hong
    2008 INTERNATIONAL CONFERENCE ON CONTROL, AUTOMATION AND SYSTEMS, VOLS 1-4, 2008, : 1037 - 1040
  • [40] Nanoscale characterization of solid electrolyte by Scanning Probe Microscopy techniques
    Wang, Zhongting
    Kotobuki, Masashi
    Lu, Li
    Zeng, Kaiyang
    ELECTROCHIMICA ACTA, 2020, 334