Influence of the transverse and longitudinal coherence in the dynamical theory of x-ray diffraction

被引：16

作者：

Mocella, V

Guigay, JP

Epelboin, Y

Härtwig, J

Baruchel, L

Mazuelas, A

机构：

[1] European Synchrotron Radiat Facil, F-38043 Grenoble, France

[2] Univ Paris 06, Lab Mineral Cristallog, CNRS, URA 009, F-75252 Paris 05, France

[3] Univ D Diderot, Lab Mineral Cristallog, CNRS, URA 009, F-75252 Paris 05, France

来源：

JOURNAL OF PHYSICS D-APPLIED PHYSICS | 1999年 / 32卷 / 10A期

关键词：

D O I：

10.1088/0022-3727/32/10A/319

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We investigate dynamical diffraction phenomena of a quasi-monochromatic x-ray beam emitted by a small source at a large distance from the sample. Under certain conditions of coherence the diffraction intensity profile in a recording plane reproduces the angular profile of the rocking curve of the crystal. The coherence requirements are stronger for thicker crystals. This has been verified in experiments at the ESRF. In these experiments the effective crystal thickness was varied by rotating the crystal around an axis perpendicular to the reflecting planes.

引用

页码：A88 / A91

页数：4

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