Heat bump on a monochromator crystal measured with X-ray grating interferometry

被引:26
|
作者
Rutishauser, Simon [1 ]
Rack, Alexander [2 ]
Weitkamp, Timm [3 ]
Kayser, Yves [1 ]
David, Christian [1 ]
Macrander, Albert T. [4 ]
机构
[1] Paul Scherrer Inst, CH-5232 Villigen, Switzerland
[2] European Synchrotron Radiat Facil, F-38043 Grenoble, France
[3] Synchrotron Soleil, F-91192 Gif Sur Yvette, France
[4] Argonne Natl Lab, Argonne, IL 60439 USA
关键词
double-crystal monochromator; grating interferometry; wavefront characterization; heat bump; DIFFERENTIAL PHASE-CONTRAST; WAVE-FRONT CHARACTERIZATION; SHEARING INTERFEROMETER; DIFFRACTION GRATINGS; OPTICS; PERFORMANCE; FABRICATION; RESOLUTION; RADIATION; BEAMLINE;
D O I
10.1107/S0909049513001817
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Deformation of the first crystal of an X-ray monochromator under the heat load of a high-power beam, commonly referred to as 'heat bump', is a challenge frequently faced at synchrotron beamlines. Here, quantitative measurements of the deformations of an externally water-cooled silicon (111) double-crystal monochromator tuned to a photon energy of 17.6 keV are reported. These measurements were made using two-dimensional hard X-ray grating interferometry, a technique that enables in situ at-wavelength wavefront investigations with high angular sensitivity. The observed crystal deformations were of the order of 100 nm in the meridional and 5 nm in the sagittal direction, which lead to wavefront slope errors of up to 4 mu rad in the meridional and a few hundred nanoradians in the sagittal direction.
引用
收藏
页码:300 / 305
页数:6
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