On the molecular effect in hydrogen molecular ions penetration through thin films

被引：3

作者：

Marenkov, E. ^{[1
]}

Kurnaev, V. ^{[1
]}

Lasa, A. ^{[2
]}

Nordlund, K. ^{[2
]}

机构：

[1] Natl Res Nucl Univ MEPhI, Moscow 115409, Russia

[2] Univ Helsinki, Dept Phys, Assoc Euratom TEKES, FI-00014 Helsinki, Finland

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2012年 / 287卷

关键词：

Molecular ions; Carbon films; Stopping power; Electronic straggling; COLLISION CASCADES; DAMAGE; BOMBARDMENT; DENSITY;

D O I：

10.1016/j.nimb.2012.07.003

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Penetration of low energy (2-12 key) hydrogen molecular ions (H-2(+)) and single protons through thin (40 angstrom) carbon films is simulated using molecular dynamic approach. It is shown that the width of energy loss spectra for the case of H-2(+) penetration is larger than that for H+ spectra (a "molecular effect") as it was previously observed in experiments [1]. This is explained by the molecular ions dissociation in the first few monolayers of the target. A simple semi-analytical model accounting for the molecular effect is provided. Results of simulations are compared with experiments. (C) 2012 Elsevier B.V. All rights reserved.

引用

页码：46 / 50

页数：5

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