Long-term testing of hermetic anodically bonded glass-silicon packages

被引:21
|
作者
Harpster, TJ [1 ]
Najafi, K [1 ]
机构
[1] Univ Michigan, Ctr Wireless Integrated Microsyst, WIMS, Ann Arbor, MI 48109 USA
关键词
D O I
10.1109/MEMSYS.2002.984293
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper reviews long-term test results obtained from a series of tests on glass-Si hermetically sealed packages. Results are presented from: 1) a 6.7-year ongoing room temperature phosphate buffered saline (PBS) soak test of 4 packages. 2) a 2.3-year ongoing in-vitro 97degreesC PBS soak test of a single package; and 3) in-situ hermeticity and biocompatibility tests from 12 packages implanted in 4 guinea pigs - 3 packages implanted in each of 2 guinea pigs for I-month and another 2 guinea pigs for 19-months, and 22-months. The long-term room temperature soak test is the longest running of any micropackage reported to date.
引用
收藏
页码:423 / 426
页数:4
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