New Defect Control for Extremely Long-Lived Widegap-White Light Emitting Diodes

被引：1

作者：

Ando, K. ^{[1
]}

Hashimoto, Y. ^{[1
]}

Kanzaki, K. ^{[1
]}

Ohashi, S. ^{[1
]}

Morita, Y. ^{[1
]}

Abe, T. ^{[1
]}

Kasada, H. ^{[1
]}

Adachi, M. ^{[2
]}

机构：

[1] Tottori Univ, Elect & Elect Dept, Tottori 6808552, Japan

[2] Japan Aerosp Explorat Agcy, Inst Space & Astronaut Sci, Sagamihara, Kanagawa 2298510, Japan

来源：

JOURNAL OF THE KOREAN PHYSICAL SOCIETY | 2008年 / 53卷 / 05期

关键词：

Widegap semiconductor; ZnSe white LEDs; All-solid state white LED long-operation ZnSe white LEDs; Current pulse-width control;

D O I：

10.3938/jkps.53.2857

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

A new current pulse-width control for long-lived ZnSe-white LEDs is presented. Using the defect controlling technique together with high quality ZnSe white LED, it is proved that bright ZnSe white LEDs have exhibited long device life-time exceeding 20000 hrs for its in practical use. It is also evidenced that the present current pulse-width control is not limited in the ZnSe system, but very effective for other widegap semiconductor bright and long-live light emitting devices of GaN and ZnO.

引用

页码：2857 / 2860

页数：4

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