New Defect Control for Extremely Long-Lived Widegap-White Light Emitting Diodes

被引：1
|
作者：
Ando, K. [1 ]
Hashimoto, Y. [1 ]
Kanzaki, K. [1 ]
Ohashi, S. [1 ]
Morita, Y. [1 ]
Abe, T. [1 ]
Kasada, H. [1 ]
Adachi, M. [2 ]
机构：
[1] Tottori Univ, Elect & Elect Dept, Tottori 6808552, Japan
[2] Japan Aerosp Explorat Agcy, Inst Space & Astronaut Sci, Sagamihara, Kanagawa 2298510, Japan
来源：
JOURNAL OF THE KOREAN PHYSICAL SOCIETY | 2008年 / 53卷 / 05期
关键词：
Widegap semiconductor; ZnSe white LEDs; All-solid state white LED long-operation ZnSe white LEDs; Current pulse-width control;
D O I：
10.3938/jkps.53.2857
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
A new current pulse-width control for long-lived ZnSe-white LEDs is presented. Using the defect controlling technique together with high quality ZnSe white LED, it is proved that bright ZnSe white LEDs have exhibited long device life-time exceeding 20000 hrs for its in practical use. It is also evidenced that the present current pulse-width control is not limited in the ZnSe system, but very effective for other widegap semiconductor bright and long-live light emitting devices of GaN and ZnO.
引用
收藏
页码：2857 / 2860
页数：4
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