Measurement of Dielectric Properties for Thick Ceramic Film on an Substrate at Microwave Frequencies by Applying the Mode-matchig Method

被引：0

作者：

Shibata, Kouji ^{[1
]}

Kobayashi, Masaki ^{[2
]}

机构：

[1] Hachinohe Inst Technol, Dept Elect & Elect Syst, Hachinohe, Aomori, Japan

[2] Hachinohe Inst Technol, Dept Biotechnol & Environm Engn, Hachinohe, Aomori, Japan

来源：

2016 IEEE MTT-S INTERNATIONAL CONFERENCE ON NUMERICAL ELECTROMAGNETIC AND MULTIPHYSICS MODELING AND OPTIMIZATION (NEMO) | 2016年

关键词：

cavity resonator; mode-matching technique; thick film; Dielectric measurement; electromagnetic analysis;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this study, the mode-matching technique (eigenmode expansion) was applied to formulate an analytical model for a split cylindrical cavity resonator with a thick ceramic film layer sandwiched between alumina substrates. Next, resonant frequencies with the TE011 mode were computed with an eigenvalue problem approach using the model formula. The Q value of the resonator was also calculated by applying the perturbation method to the analytical model. The validity of the proposed analytical technique was confirmed using the procedure described below by applying this method to the estimation of complex permittivity for thick film with an inverse problem approach.

引用

页数：4

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