Inducing Nanoscale Morphology Changes of Pentaerythritol Tetranitrate Using a Heated Atomic Force Microscope Cantilever

被引：2

作者：

Nafday, Omkar A. ^{[1
]}

Weeks, Brandon L. ^{[1
]}

King, William P. ^{[2
]}

Lee, Jungchul ^{[2
]}

机构：

[1] Texas Tech Univ, Dept Chem Engn, Lubbock, TX 79409 USA

[2] Univ Illinois, Dept Mech Engn, Champaign, IL 61820 USA

来源：

JOURNAL OF ENERGETIC MATERIALS | 2009年 / 27卷 / 01期

关键词：

atomic force microscope; pentaerythritol tetranitrate; temperature; thermal cantilever; THERMAL-DECOMPOSITION; PETN; CRYSTALS; DESIGN; SIZE; RDX;

D O I：

10.1080/07370650802328830

中图分类号：

O69 [应用化学];

学科分类号：

081704 ;

摘要：

Controlling the morphology of pentaerythritol tetranitrate (PETN) is an important aspect in the nanodetonics research area. Detonation properties are highly dependent on surface area and morphology of PETN. For the first time we show that changes in morphology can be modified at the nanoscale by using a heated atomic force microscope (AFM) cantilever. At temperatures of65C, faceting of PETN islands is observed, whereas at higher temperatures (124C) the height of the islands decrease by an order of magnitude.

引用

页码：1 / 16

页数：16

共 50 条

[41] Nanoscale operation of a living cell using an atomic force microscope with a nanoneedle
Obataya, I
Nakamura, C
Han, S
Nakamura, N
Miyake, J
NANO LETTERS, 2005, 5 (01) : 27 - 30
[42] Imaging elastic property of surfaces at nanoscale using atomic force microscope
Banerjee, S.
Gayathri, N.
Dash, S.
Tyagi, A. K.
Raj, Baldev
APPLIED SURFACE SCIENCE, 2009, 256 (02) : 503 - 507
[43] Note: Vibration reduction control of an atomic force microscope using an additional cantilever
Kim, Chulsoo
Jung, Jongkyu
Park, Kyihwan
REVIEW OF SCIENTIFIC INSTRUMENTS, 2011, 82 (11):
[44] Nanoscale graphene and carbon nanotube lithography using an atomic force microscope
Kumar, Kitu
Sul, Onejae
Tsai, Yao-Tsan
Choi, Daniel
Prasad, M. G.
Fisher, Frank
Strauf, Stefan
Yang, E. H.
IMECE 2009: PROCEEDINGS OF THE ASME INTERNATIONAL MECHANICAL ENGINEERING CONGRESS AND EXPOSITION, VOL 12, PTS A AND B, 2010, : 417 - 418
[45] Atomic Force Microscope Control Using a Cantilever Model with Two Modes of Resonance
Radulescu, Iulia-Cristina
Besancon, Gildas
Voda, Alina
Stefanoiu, Dan
2015 20TH INTERNATIONAL CONFERENCE ON CONTROL SYSTEMS AND COMPUTER SCIENCE, 2015, : 127 - 132
[46] Enhanced sensitivity to force gradients by using higher flexural modes of the atomic force microscope cantilever
M. Hoummady
E. Farnault
Applied Physics A, 1998, 66 : S361 - S364
[47] Enhanced sensitivity to force gradients by using higher flexural modes of the atomic force microscope cantilever
Hoummady, M
Farnault, E
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1998, 66 (Suppl 1): : S361 - S364
[48] Reduction in feedback bandwidth of the force-controlled atomic force microscope using a polyimide cantilever
Kato, N
Matsumoto, T
Kikuta, H
Nakamura, Y
Iwata, K
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2001, 40 (11): : 6594 - 6599
[49] Reduction in feedback bandwidth of the force-controlled atomic force microscope using a polyimide cantilever
Hosokawa, T.
Goto, K.
Ohuchi, M.
Ichinose, K
Funato, Y.
Kaneda, T.
1600, Japan Society of Applied Physics (40):
[50] Cantilever contribution to the total electrostatic force measured with the atomic force microscope
Guriyanova, Svetlana
Golovko, Dmytro S.
Bonaccurso, Elmar
MEASUREMENT SCIENCE AND TECHNOLOGY, 2010, 21 (02)

← 1 2 3 4 5 →